| An expanded evaluation of protein function prediction methods shows an improvement in accuracy Y Jiang, TR Oron, WT Clark, AR Bankapur, D D’Andrea, R Lepore, ... Genome biology 17, 1-19, 2016 | 414 | 2016 |
| The CAFA challenge reports improved protein function prediction and new functional annotations for hundreds of genes through experimental screens N Zhou, Y Jiang, TR Bergquist, AJ Lee, BZ Kacsoh, AW Crocker, ... Genome biology 20, 1-23, 2019 | 361 | 2019 |
| Drift correction methods for gas chemical sensors in artificial olfaction systems: techniques and challenges S Di Carlo, M Falasconi INTECH Open Access Publisher, 2012 | 111 | 2012 |
| A watchdog processor to detect data and control flow errors A Benso, S Di Carlo, G Di Natale, P Prinetto 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 144-148, 2003 | 85 | 2003 |
| Control-flow checking via regular expressions A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri Proceedings 10th Asian Test Symposium, 299-303, 2001 | 66 | 2001 |
| Multi-level and hybrid modelling approaches for systems biology R Bardini, G Politano, A Benso, S Di Carlo Computational and structural biotechnology journal 15, 396-402, 2017 | 64 | 2017 |
| Increasing pattern recognition accuracy for chemical sensing by evolutionary based drift compensation S Di Carlo, M Falasconi, E Sánchez, A Scionti, G Squillero, A Tonda Pattern Recognition Letters 32 (13), 1594-1603, 2011 | 60 | 2011 |
| Software-based self-test of set-associative cache memories S Di Carlo, P Prinetto, A Savino IEEE Transactions on Computers 60 (7), 1030-1044, 2010 | 60 | 2010 |
| HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs A Benso, S Chiusano, S Di Carlo, P Prinetto, F Ricciato, M Spadari, ... Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000 | 55 | 2000 |
| March AB, March AB1: new March tests for unlinked dynamic memory faults A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto IEEE International Conference on Test, 2005., 8 pp.-841, 2005 | 51 | 2005 |
| An area-efficient 2-D convolution implementation on FPGA for space applications S Di Carlo, G Gambardella, M Indaco, D Rolfo, G Tiotto, P Prinetto 2011 IEEE 6th international design and test workshop (IDT), 88-92, 2011 | 50 | 2011 |
| Statistical reliability estimation of microprocessor-based systems A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale IEEE Transactions on Computers 61 (11), 1521-1534, 2011 | 50 | 2011 |
| A programmable BIST architecture for clusters of multiple-port SRAMs A Benso, S Di Carlo, G Di Natale, P Prinetto, ML Bodoni Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000 | 50 | 2000 |
| Cost of sickness absenteeism during seasonal influenza outbreaks of medium intensity among health care workers MM Gianino, G Politano, A Scarmozzino, M Stillo, V Amprino, S Di Carlo, ... International journal of environmental research and public health 16 (5), 747, 2019 | 48 | 2019 |
| A functional verification based fault injection environment A Benso, A Bosio, S Di Carlo, R Mariani 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 46 | 2007 |
| IEEE standard 1500 compliance verification for embedded cores A Benso, S Di Carlo, P Prinetto, Y Zorian IEEE transactions on very large scale integration (VLSI) systems 16 (4), 397-407, 2008 | 43 | 2008 |
| A software-based self test of CUDA Fermi GPUs S Di Carlo, G Gambardella, M Indaco, I Martella, P Prinetto, D Rolfo, ... 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 42 | 2013 |
| Data criticality estimation in software applications A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri International test conference, 802-810, 2003 | 41 | 2003 |
| Syra: Early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems A Vallero, A Savino, A Chatzidimitriou, M Kaliorakis, M Kooli, M Riera, ... IEEE Transactions on Computers 68 (5), 765-783, 2018 | 38 | 2018 |
| Specification and design of a new memory fault simulator A Benso, S Di Carlo, G Di Natale, P Prinetto Proceedings of the 11th Asian Test Symposium, 2002.(ATS'02)., 92-97, 2002 | 38 | 2002 |
Paolo PRINETTOProfessor of Computer Engineering, Politecnico di Torino, Torino (Italy)在 polito.it 的电子邮件经过验证
