Optical and transport measurement and first-principles determination of the ScN band gap R Deng, BD Ozsdolay, PY Zheng, SV Khare, D Gall Physical Review B 91 (4), 045104, 2015 | 127 | 2015 |
Ni doping on Cu surfaces: Reduced copper resistivity PY Zheng, RP Deng, D Gall Applied Physics Letters 105 (13), 2014 | 84 | 2014 |
The anisotropic size effect of the electrical resistivity of metal thin films: Tungsten P Zheng, D Gall Journal of Applied Physics 122 (13), 2017 | 81 | 2017 |
Electron channeling in TiO2 coated Cu layers P Zheng, T Zhou, D Gall Semiconductor Science and Technology 31 (5), 055005, 2016 | 57 | 2016 |
The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges T Zhou, P Zheng, SC Pandey, R Sundararaman, D Gall Journal of Applied Physics 123 (15), 2018 | 56 | 2018 |
Optical and electron transport properties of rock-salt Sc1− xAlxN R Deng, PY Zheng, D Gall Journal of Applied Physics 118 (1), 2015 | 44 | 2015 |
Surface roughness dependence of the electrical resistivity of W (001) layers PY Zheng, T Zhou, BJ Engler, JS Chawla, R Hull, D Gall Journal of Applied Physics 122 (9), 2017 | 43 | 2017 |
Epitaxial growth of tungsten layers on MgO (001) P Zheng, BD Ozsdolay, D Gall Journal of Vacuum Science & Technology A 33 (6), 2015 | 38 | 2015 |
Electron scattering at epitaxial Ni (001) surfaces E Milosevic, P Zheng, D Gall IEEE Transactions on Electron Devices 66 (10), 4326-4330, 2019 | 24 | 2019 |
Effect of electronegativity on electron surface scattering in thin metal layers A Jog, E Milosevic, P Zheng, D Gall Applied Physics Letters 120 (4), 2022 | 15 | 2022 |
Microstructure and age hardening of C276 alloy coatings CP Mulligan, R Wei, G Yang, P Zheng, R Deng, D Gall Surface and Coatings Technology 270, 299-304, 2015 | 15 | 2015 |
Anisotropic resistivity size effect in epitaxial Mo (001) and Mo (011) layers A Jog, P Zheng, T Zhou, D Gall Nanomaterials 13 (6), 957, 2023 | 12 | 2023 |
The investigation of magneto-transport properties of PtSb2 single crystal synthesized by sb-flux method K Zhang, X Wang, PY Zheng, KK Huang, CQ Hu, SH Feng, M Wen, ... Journal of Alloys and Compounds 694, 935-938, 2017 | 1 | 2017 |
Erratum: Electron channeling in TiO2 coated Cu layers (2016 Semiconductor Science and Technology 31 055005) P Zheng, T Zhou, D Gall Semiconductor Science and Technology 31 (6), 069601, 2016 | 1 | 2016 |
Erratum: Electron channeling in TiO2 coated Cu layers (2016 Semiconductor P Zheng, T Zhou, D Gall Technology 31, 055005, 2016 | | 2016 |
Electron Scattering at Surfaces and Interfaces of Transition Metals P Zheng Rensselaer Polytechnic Institute, 2015 | | 2015 |