Deep learning library testing via effective model generation Z Wang, M Yan, J Chen, S Liu, D Zhang Proceedings of the 28th ACM Joint Meeting on European Software Engineering …, 2020 | 125 | 2020 |
Practical accuracy estimation for efficient deep neural network testing J Chen, Z Wu, Z Wang, H You, L Zhang, M Yan ACM Transactions on Software Engineering and Methodology (TOSEM) 29 (4), 1-35, 2020 | 71 | 2020 |
Exposing numerical bugs in deep learning via gradient back-propagation M Yan, J Chen, X Zhang, L Tan, G Wang, Z Wang Proceedings of the 29th ACM Joint Meeting on European Software Engineering …, 2021 | 35 | 2021 |
Revisiting deep neural network test coverage from the test effectiveness perspective M Yan, J Chen, X Cao, Z Wu, Y Kang, Z Wang Journal of Software: Evolution and Process 36 (4), e2561, 2024 | 26* | 2024 |
深度神经网络测试研究综述 王 赞 , 闫 明 , 刘 爽, 陈俊洁, 张栋迪, 吴 卓陈 翔 软件学报 5 (31), 1255-1275, 2020 | 7 | 2020 |
Coco: Testing code generation systems via concretized instructions M Yan, J Chen, JM Zhang, X Cao, C Yang, M Harman arXiv preprint arXiv:2308.13319, 2023 | 5 | 2023 |
An empirical study on numerical bugs in deep learning programs G Wang, Z Wang, J Chen, X Chen, M Yan Proceedings of the 37th IEEE/ACM International Conference on Automated …, 2022 | 4 | 2022 |
Stratified random sampling for neural network test input selection Z Wu, Z Wang, J Chen, H You, M Yan, L Wang Information and Software Technology 165, 107331, 2024 | 2 | 2024 |
基于数据变异的神经网络测试用例选择方法 曹雪洁, 陈俊洁, 闫明, 尤翰墨, 吴卓, 王赞 软件学报, 1-20, 2023 | | 2023 |
Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations M Yan, J Chen, H Mao, J Jiang, J Hao, X Li, Z Tian, Z Chen, D Li, Z Xian, ... 2023 IEEE/ACM 45th International Conference on Software Engineering …, 2023 | | 2023 |