| A review of gate tunneling current in MOS devices JC Ranuárez, MJ Deen, CH Chen Microelectronics reliability 46 (12), 1939-1956, 2006 | 250 | 2006 |
| An effective gate resistance model for CMOS RF and noise modeling X Jin, JJ Ou, CH Chen, W Liu, MJ Deen, PR Gray, C Hu International Electron Devices Meeting 1998. Technical Digest (Cat. No …, 1998 | 240 | 1998 |
| MOSFET modeling for RF IC design Y Cheng, MJ Deen, CH Chen IEEE Transactions on Electron Devices 52 (7), 1286-1303, 2005 | 205 | 2005 |
| Channel noise modeling of deep submicron MOSFETs CH Chen, MJ Deen IEEE Transactions on Electron Devices 49 (8), 1484-1487, 2002 | 186 | 2002 |
| Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements CH Chen, MJ Deen, Y Cheng, M Matloubian IEEE Transactions on Electron Devices 48 (12), 2884-2892, 2001 | 168 | 2001 |
| Noncontact wearable wireless ECG systems for long-term monitoring S Majumder, L Chen, O Marinov, CH Chen, T Mondal, MJ Deen IEEE reviews in biomedical engineering 11, 306-321, 2018 | 159 | 2018 |
| A general noise and S-parameter deembedding procedure for on-wafer high-frequency noise measurements of MOSFETs CH Chen, MJ Deen IEEE Transactions on Microwave Theory and Techniques 49 (5), 1004-1005, 2001 | 144 | 2001 |
| High frequency noise of MOSFETs I Modeling CH Chen, MJ Deen Solid-State Electronics 42 (11), 2069-2081, 1998 | 142 | 1998 |
| High-frequency noise of modern MOSFETs: Compact modeling and measurement issues MJ Deen, CH Chen, S Asgaran, GA Rezvani, J Tao, Y Kiyota IEEE Transactions on Electron Devices 53 (9), 2062-2081, 2006 | 125 | 2006 |
| Analytical modeling of MOSFETs channel noise and noise parameters S Asgaran, MJ Deen, CH Chen IEEE Transactions on Electron Devices 51 (12), 2109-2114, 2004 | 119 | 2004 |
| High-frequency small signal AC and noise modeling of MOSFETs for RF IC design Y Cheng, CH Chen, M Matloubian, MJ Deen IEEE Transactions on Electron Devices 49 (3), 400-408, 2002 | 110 | 2002 |
| Integrated water quality monitoring system with pH, free chlorine, and temperature sensors Y Qin, AU Alam, S Pan, MMR Howlader, R Ghosh, NX Hu, H Jin, S Dong, ... Sensors and Actuators B: Chemical 255, 781-790, 2018 | 101 | 2018 |
| Design of the input matching network of RF CMOS LNAs for low-power operation S Asgaran, MJ Deen, CH Chen IEEE Transactions on Circuits and Systems I: Regular Papers 54 (3), 544-554, 2007 | 95 | 2007 |
| A 4-mW monolithic CMOS LNA at 5.7 GHz with the gate resistance used for input matching S Asgaran, MJ Deen, CH Chen IEEE Microwave and Wireless Components Letters 16 (4), 188-190, 2006 | 72 | 2006 |
| Effects of hot-carrier stress on the performance of CMOS low-noise amplifiers S Naseh, MJ Deen, CH Chen IEEE Transactions on Device and Materials Reliability 5 (3), 501-508, 2005 | 50 | 2005 |
| MOSFET modeling for low noise, RF circuit design MJ Deen, CH Chen, Y Cheng Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No …, 2002 | 49 | 2002 |
| Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers S Naseh, MJ Deen, CH Chen Microelectronics Reliability 46 (2-4), 201-212, 2006 | 48 | 2006 |
| Analytical Determination of MOSFET's High-Frequency Noise Parameters From NF Measurements and Its Application in RFIC Design S Asgaran, MJ Deen, CH Chen, GA Rezvani, Y Kamali, Y Kiyota IEEE journal of solid-state circuits 42 (5), 1034-1043, 2007 | 34 | 2007 |
| High frequency noise of MOSFETs. II. Experiments CH Chen, MJ Deen, ZX Yan, M Schroter, C Enz Solid-State Electronics 42 (11), 2083-2092, 1998 | 34 | 1998 |
| Direct calculation of metal–oxide–semiconductor field effect transistor high frequency noise parameters CH Chen, MJ Deen Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (2 …, 1998 | 33 | 1998 |
MJ DeenDistinguished University Professor, McMaster University在 mcmaster.ca 的电子邮件经过验证
