Parametric noise injection: Trainable randomness to improve deep neural network robustness against adversarial attack Z He, AS Rakin, D Fan IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 588-597, 2019 | 310 | 2019 |
Bit-Flip Attack: Crushing Neural Network with Progressive Bit Search Z He, AS Rakin, D Fan Proceedings of the IEEE International Conference on Computer Vision (ICCV …, 2019 | 225* | 2019 |
TBT: Targeted Neural Network Attack with Bit Trojan AS Rakin, Z He, D Fan Conference on Computer Vision and Pattern Recognition (CVPR), 2020 | 221 | 2020 |
Noise injection adaption: End-to-end ReRAM crossbar non-ideal effect adaption for neural network mapping Z He, J Lin, R Ewetz, JS Yuan, D Fan Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 189 | 2019 |
CMP-PIM: an energy-efficient comparator-based processing-in-memory neural network accelerator Z He, S Angizi, AS Rakin, D Fan Proceedings of the 55th Annual Design Automation Conference (DAC), 105, 2018 | 122* | 2018 |
Elf: accelerate high-resolution mobile deep vision with content-aware parallel offloading W Zhang, Z He, L Liu, Z Jia, Y Liu, M Gruteser, D Raychaudhuri, Y Zhang (MobiCom) Proceedings of the 27th Annual International Conference on Mobile …, 2021 | 116 | 2021 |
Non-Structured DNN Weight Pruning--Is It Beneficial in Any Platform? X Ma, S Lin, S Ye, Z He, L Zhang, G Yuan, SH Tan, Z Li, D Fan, X Qian, ... (TNNLS) IEEE Transactions on Neural Networks and Learning Systems, 2021 | 110* | 2021 |
MRIMA: An MRAM-based in-memory accelerator S Angizi, Z He, A Awad, D Fan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 102 | 2019 |
Defending and Harnessing the Bit-Flip based Adversarial Weight Attack Z He, AS Rakin, J Li, C Chakrabarti, D Fan Conference on Computer Vision and Pattern Recognition (CVPR), 2020 | 85 | 2020 |
Simultaneously optimizing weight and quantizer of ternary neural network using truncated gaussian approximation Z He, D Fan Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019 | 85 | 2019 |
2D MoS 2-based threshold switching memristor for artificial neuron D Dev, A Krishnaprasad, MS Shawkat, Z He, S Das, D Fan, HS Chung, ... (EDL) IEEE Electron Device Letters 41 (6), 936-939, 2020 | 82 | 2020 |
IMCE: Energy-efficient bit-wise in-memory convolution engine for deep neural network S Angizi, Z He, F Parveen, D Fan 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 111-116, 2018 | 81 | 2018 |
T-BFA: Targeted bit-flip adversarial weight attack AS Rakin, Z He, J Li, F Yao, C Chakrabarti, D Fan (TPAMI) Transactions on Pattern Analysis and Machine Intelligence, 2021 | 77 | 2021 |
PIMA-logic: A novel processing-in-memory architecture for highly flexible and energy-efficient logic computation S Angizi, Z He, D Fan Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 77 | 2018 |
Optimize deep convolutional neural network with ternarized weights and high accuracy Z He, B Gong, D Fan 2019 IEEE Winter Conference on Applications of Computer Vision (WACV), 913-921, 2019 | 68 | 2019 |
Defending Bit-Flip Attack through DNN Weight Reconstruction J Li, AS Rakin, Y Xiong, L Chang, Z He, D Fan, C Chakrabarti 2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020 | 61 | 2020 |
A fully onchip binarized convolutional neural network fpga impelmentation with accurate inference L Yang, Z He, D Fan Proceedings of the International Symposium on Low Power Electronics and …, 2018 | 57 | 2018 |
Design and evaluation of a spintronic in-memory processing platform for nonvolatile data encryption S Angizi, Z He, N Bagherzadeh, D Fan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 56 | 2017 |
HielM: Highly flexible in-memory computing using STT MRAM F Parveen, Z He, S Angizi, D Fan 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 361-366, 2018 | 48 | 2018 |
RADAR: Run-time Adversarial Weight Attack Detection and Accuracy Recovery J Li, AS Rakin, Z He, D Fan, C Chakrabarti (DATE-2021) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021 | 44 | 2021 |