| Three-dimensional interactive device and operation method thereof HW Lin, HW Wang, SP Dong US Patent 8,923,562, 2014 | 46 | 2014 |
| Virtual touch system HW Wang, FC Yang, CC Wang, SP Dong US Patent App. 12/981,492, 2012 | 13 | 2012 |
| Reflective scatterometer DM Shyu, Y Ku, SY Chou, SP Dong, WT Hsu US Patent 7,864,324, 2011 | 7 | 2011 |
| Workflow monitoring and analysis system and method thereof HW Lin, HW Wang, SP Dong US Patent 9,613,328, 2017 | 5 | 2017 |
| Method and apparatus for scatterfield microscopical measurement SY Chou, SP Dong, WT Hsu, DM Shyu, CL Wu, Y Ku, CH Sung US Patent 7,872,741, 2011 | 4 | 2011 |
| Using chromatic confocal apparatus for in situ rolling thickness measurement in hot embossing process YC Chen, SP Dong, CC Wang, SH Kuo, WC Wang, HM Tai Instrumentation, Metrology, and Standards for Nanomanufacturing IV 7767, 77670P, 2010 | 3 | 2010 |
| Spatial 3d interactive instrument HW Wang, FC Yang, SP Dong, LI Tsung-Han US Patent App. 13/297,591, 2013 | 2 | 2013 |
| System for alignment measurement for rolling embossed double-sided optical film and method thereof SP Dong, HM Tai, FS Yang US Patent 8,223,335, 2012 | 2 | 2012 |
| Measurement device and method of double-sided optical films SP Dong, HM Tai, DM Shyu, CT Chen, CM Yeh, YC Chen, CC Huang US Patent App. 12/877,173, 2011 | 1 | 2011 |
| Flatness measuring device CH Chen, SP Dong, TA Mario US Patent App. 15/404,776, 2018 | | 2018 |
| Positioning measurement device and the method thereof CW Chen, FC Yang, P Yen, S Dong US Patent App. 15/395,344, 2017 | | 2017 |
| A new approach to calibration of printed circuit board coordinates: 2D-Depth sensor applied to robotic screwdrivers assembly systems SP Dong, HW Wang, TY Wu, CM Yeh Advanced Materials Research 939, 445-450, 2014 | | 2014 |
| Misalignment estimation for double-sided lenticular lens films based on low-dimensioned signal analysis CT Chen, SP Dong, HM Tai, TY Wu Applications of Digital Image Processing XXXII 7443, 74431B, 2009 | | 2009 |
| Overlay measurement based on dual-overlay grating image DM Shyu, Y Ku, SP Dong Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008 | | 2008 |
| Overlay measurement based on dual-overlay grating image [6922-24] D Shyu, Y Ku, S Dong PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 6922 (1 …, 2008 | | 2008 |
