| Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering X Llovet, A Moy, PT Pinard, JH Fournelle Progress in Materials Science 120, 100818, 2021 | 89 | 2021 |
| Measurements of absolute L-and M-subshell x-ray production cross sections of Pb by electron impact A Moy, C Merlet, X Llovet, O Dugne Journal of Physics B: Atomic, Molecular and Optical Physics 46 (11), 115202, 2013 | 40 | 2013 |
| M-subshell ionization cross sections of U by electron impact A Moy, C Merlet, X Llovet, O Dugne Journal of Physics B: Atomic, Molecular and Optical Physics 47 (5), 055202, 2014 | 25 | 2014 |
| ϕ(ρz) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis Program A Moy, J Fournelle Microscopy and Microanalysis 27 (2), 284-296, 2021 | 13 | 2021 |
| Standardless quantification of heavy elements by electron probe microanalysis A Moy, C Merlet, O Dugne Analytical chemistry 87 (15), 7779-7786, 2015 | 13 | 2015 |
| Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old Approach A Moy, J Fournelle, A Von Der Handt Microscopy and Microanalysis 25 (3), 664-674, 2019 | 12 | 2019 |
| Measurements of absolute M-subshell X-ray production cross sections of Th by electron impact A Moy, C Merlet, O Dugne Chemical Physics 440, 18-24, 2014 | 12 | 2014 |
| ϕ(ρz) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified ϕ(ρz) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung … A Moy, J Fournelle Microscopy and Microanalysis 27 (2), 266-283, 2021 | 11 | 2021 |
| Solving the iron quantification problem in low-kV EPMA: An essential step toward improved analytical spatial resolution in electron probe microanalysis—Olivines A Moy, JH Fournelle, A Handt American Mineralogist 104 (8), 1131-1142, 2019 | 9 | 2019 |
| Measurements of absolute Mα x‐ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact C Merlet, A Moy, X Llovet, O Dugne Surface and Interface Analysis 46 (12-13), 1170-1173, 2014 | 9 | 2014 |
| Badgerfilm: An open source thin film analysis program A Moy, J Fournelle Microscopy and Microanalysis 26 (S2), 496-498, 2020 | 8 | 2020 |
| Analytical Spatial Resolution in EPMA: What is it and How can it be Estimated? A Moy, J Fournelle Microscopy and Microanalysis 23 (S1), 1098-1099, 2017 | 6 | 2017 |
| Electron probe microanalysis of transition metals using L lines: The effect of self-absorption X Llovet, A Moy, JH Fournelle Microscopy and Microanalysis 28 (1), 123-137, 2022 | 5 | 2022 |
| An improved average atomic number calculation for estimating backscatter and continuum production in compounds J Donovan, A Ducharme, JJ Schwab, A Moy, Z Gainsforth, B Wade, ... Microscopy and Microanalysis 29 (4), 1436-1449, 2023 | 3 | 2023 |
| The EPMA matrix correction: All elements must be present for accuracy: Four examples with B, C, O and F J Fournelle, A Moy, W Nachlas, J Donovan Microscopy and Microanalysis 26 (S2), 58-59, 2020 | 3 | 2020 |
| Proposal: Let's Develop a Community Consensus K-ratio Database N Ritchie, D Newbury, E Bullock, P Carpenter, J Donovan, J Fournelle, ... Microscopy and Microanalysis 26 (S2), 1774-1776, 2020 | 3 | 2020 |
| Optimization of actinide quantification by electron probe microanalysis A Moy, C Merlet, X Llovet, O Dugne 2013 3rd International Conference on Advancements in Nuclear Instrumentation …, 2013 | 3 | 2013 |
| Reconstructing diagenetic mineral reactions from silicified horizons of the Paleoproterozoic Biwabik Iron Formation, Minnesota S Duncanson, L Brengman, J Johnson, A Eyster, J Fournelle, A Moy American Mineralogist 109 (2), 339-358, 2024 | 2 | 2024 |
| On the importance of including all elements in the EPMA matrix correction A Moy, J Fournelle, W Nachlas, M Dungan, A Locock, E Bullock, ... Microscopy and Microanalysis 29 (Supplement_1), 855-856, 2023 | 2 | 2023 |
| a new method for dead time calibration and a new expression for correction of WDS Intensities for microanalysis JJ Donovan, A Moy, A von der Handt, Z Gainsforth, JL Maner, W Nachlas, ... Microscopy and Microanalysis 29 (3), 1096-1110, 2023 | 2 | 2023 |
John FournelleUniversity of Wisconsin在 geology.wisc.edu 的电子邮件经过验证
John FournelleUniversity of Wisconsin在 geology.wisc.edu 的电子邮件经过验证
Xavier LlovetUniversitat de Barcelona在 ccit.ub.edu 的电子邮件经过验证