| Inkjet-printed EGFET-based physical unclonable function—Design, evaluation, and fabrication AT Erozan, GC Marques, MS Golanbari, R Bishnoi, S Dehm, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018 | 43 | 2018 |
| A smooth EKV-based DC model for accurate simulation of printed transistors and their process variations F Rasheed, MS Golanbari, GC Marques, MB Tahoori, ... IEEE Transactions on Electron Devices 65 (2), 667-673, 2018 | 39 | 2018 |
| Temperature-aware dynamic voltage scaling to improve energy efficiency of near-threshold computing S Kiamehr, M Ebrahimi, MS Golanbari, MB Tahoori IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7), 2017 | 39 | 2017 |
| VAET-STT: Variation aware STT-MRAM analysis and design space exploration tool SM Nair, R Bishnoi, MS Golanbari, F Oboril, F Hameed, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 23 | 2017 |
| Leveraging aging effect to improve SRAM-based true random number generators S Kiamehr, MS Golanbari, MB Tahoori Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 20 | 2017 |
| Analysis and optimization of flip-flops under process and runtime variations MS Golanbari, S Kiamehr, MB Tahoori, S Nassif Sixteenth International Symposium on Quality Electronic Design, 191-196, 2015 | 19 | 2015 |
| Design and evaluation of physical unclonable function for inorganic printed electronics AT Erozan, MS Golanbari, R Bishnoi, J Aghassi-Hagmann, MB Tahoori 2018 19th International Symposium on Quality Electronic Design (ISQED), 419-424, 2018 | 17 | 2018 |
| Aging guardband reduction through selective flip-flop optimization MS Golanbari, S Kiamehr, M Ebrahimi, MB Tahoori 2015 20th IEEE European Test Symposium (ETS), 1-6, 2015 | 17 | 2015 |
| Reliable memory PUF design for low-power applications MS Golanbari, S Kiamehr, R Bishnoi, MB Tahoori 2018 19th International Symposium on Quality Electronic Design (ISQED), 207-213, 2018 | 16 | 2018 |
| VAET-STT: A variation aware estimator tool for STT-MRAM based memories SM Nair, R Bishnoi, MS Golanbari, F Oboril, MB Tahoori Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 16 | 2017 |
| Variation-aware near threshold circuit synthesis MS Golanbari, S Kiamehr, M Ebrahimi, MB Tahoori 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2016 | 14 | 2016 |
| Hold-time violation analysis and fixing in near-threshold region MS Golanbari, S Kiamehr, MB Tahoori 2016 26th International Workshop on Power and Timing Modeling, Optimization …, 2016 | 12 | 2016 |
| Maximizing energy efficiency in NTC by variation-aware microprocessor pipeline optimization A Gebregiorgis, MS Golanbari, S Kiamehr, F Oboril, MB Tahoori Proceedings of the 2016 International Symposium on Low Power Electronics and …, 2016 | 12 | 2016 |
| Selective flip-flop optimization for reliable digital circuit design MS Golanbari, S Kiamehr, M Ebrahimi, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 11 | 2019 |
| Bayesian optimized importance sampling for high sigma failure rate estimation DD Weller, M Hefenbrock, MS Golanbari, M Beigl, MB Tahoori 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019 | 10 | 2019 |
| Modeling and testing of aging faults in FinFET memories for automotive applications G Tshagharyan, G Harutyunyan, Y Zorian, A Gebregiorgis, MS Golanbari, ... 2018 IEEE International Test Conference (ITC), 1-10, 2018 | 10 | 2018 |
| A cross-layer approach for resiliency and energy efficiency in near threshold computing MS Golanbari, A Gebregiorgis, F Oboril, S Kiamehr, MB Tahoori 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2016 | 10 | 2016 |
| Aging-aware coding scheme for memory arrays MS Golanbari, N Sayed, M Ebrahimi, MHM Esfahany, S Kiamehr, ... 2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017 | 9 | 2017 |
| Runtime adjustment of IoT system-on-chips for minimum energy operation MS Golanbari, MB Tahoori Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 8 | 2018 |
| Post-fabrication calibration of near-threshold circuits for energy efficiency MS Golanbari, S Kiamehr, F Oboril, A Gebregiorgis, MB Tahoori 2017 18th International Symposium on Quality Electronic Design (ISQED), 385-390, 2017 | 8 | 2017 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, Germany在 kit.edu 的电子邮件经过验证
