| Towards Bayesian network methodology for predicting the equipment health factor of complex semiconductor systems MF Bouaziz, E Zamai, F Duvivier International Journal of Production Research 51 (15), 4597-4617, 2013 | 39 | 2013 |
| Dependability of complex semiconductor systems: Learning Bayesian networks for decision support MF Bouaziz, E Zamai, F Duvivier, S Hubac 2011 3rd International Workshop on Dependable Control of Discrete Systems, 7-12, 2011 | 18 | 2011 |
| Automatic detection of spatial signature on wafermaps in a high volume production F Duvivier Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance …, 1999 | 18 | 1999 |
| Application of a yield model merging critical areas and defectivity to industrial products S Levasseur, F Duvivier 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 1997 | 17 | 1997 |
| Application of a survey sampling critical area computation tool in a manufacturing environment [IC yield] F Duvivier, GA Allan Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance …, 1996 | 9 | 1996 |
| Driving style indicator using UDRIVE NDS data L Guyonvarch, T Hermitte, F Duvivier, C Val, A Guillaume Traffic injury prevention 19 (sup1), S189-S191, 2018 | 8 | 2018 |
| Approximation of critical area of ICs with simple parameters extracted from the layout F Duvivier, M Rivier Proceedings of International Workshop on Defect and Fault Tolerance in VLSI, 1-9, 1995 | 8 | 1995 |
| Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM F Duvivier, M Rivier, B Burtschy, JJ Charlot Proceedings of 1993 IEEE International Workshop on Defect and Fault …, 1993 | 3 | 1993 |
| Dimensionality reduction to improve search time and memory footprint in content-retrieval tasks: application to semiconductor inspection images T Vial, F Dhouib, L Roger, A Blangero, F Duvivier, K Sayadi, MN Faraggi Advances in Industrial and Manufacturing Engineering 5, 100097, 2022 | 1 | 2022 |
| Modélisation du rendement de fabrication des circuits intégrés F Duvivier Ecole Nationale Supérieure des Télécommunications, 1995 | 1 | 1995 |
| Towards a cross-functional analysis of industrial data M Lutz, T Vial, F Duvivier European Network for Business and Industrial Statistics (ENBIS), 2015 | | 2015 |
| Equipment Health Factor calculation for equipment diagnosis and maintenance optimization in complex semiconductor workshops MF Bouaziz, QB Duong, É Zamaï, S Hubac, F Duvivier Workshop: Applications industrielles" Sûreté, Surveillance, Supervision …, 2012 | | 2012 |
| Sûreté de fonctionnement des équipements de fabrication dans les ateliers semi-conducteurs MF Bouaziz, É Zamaï, S Monot, F Duvivier, S Hubac 4ème Workshop du Groupement d'Intérêt Scientifique" Surveillance, Sûreté et …, 2011 | | 2011 |
| Towards a Bayesian Network methodology to improve maintenance of complex semiconductor systems MF Bouaziz, E Zamaï, S Monot, F Duvivier, S Hubac Advances in Safety, Reliability and Risk Management, 21-21, 2011 | | 2011 |
| ENST, 46, rue Barrault 75013 Paris FRANCE F Duvivier, M Rivier Proceedings, the IEEE International Workshop on Defect and Fault Tolerance …, 1995 | | 1995 |
| The IEEE International Workshop on Defect and Fault Tolerance in VLSl Systems F Duvivier, M Rivier, PK Nag, W Maly, GA Allan, AJ Walton, L Links, ... | | |
| Dependability of complex semiconductor systems MF BOUAZIZ, E ZAMAI, F DUVIVIER, S HUBAC | | |
| Advances in Industrial and Manufacturing Engineering T Vial, F Dhouib, L Roger, A Blangero, F Duvivier, K Sayadi, MN Faraggi | | |
