| An Accurate Characterization of Capture Time Constants in GaN HEMTs JL Gomes, LC Nunes, CF Gonçalves, JC Pedro IEEE Transactions on Microwave Theory and Techniques 67 (7), 2465-2474, 2019 | 47 | 2019 |
| The Impact of Long-Term Memory Effects on the Linearizability of GaN HEMT-Based Power Amplifiers JL Gomes, LC Nunes, FM Barradas, A Cooman, AEF de Jong, RM Heeres, ... IEEE Transactions on Microwave Theory and Techniques 70 (2), 1377-1390, 2021 | 16 | 2021 |
| A simple method to extract trapping time constants of GaN HEMTs LC Nunes, JL Gomes, PM Cabral, JC Pedro 2018 IEEE/MTT-S International Microwave Symposium-IMS, 716-719, 2018 | 16 | 2018 |
| Characterization, Modeling, and Compensation of the Dynamic Self-Biasing Behavior of GaN HEMT-Based Power Amplifiers PM Tomé, FM Barradas, LC Nunes, JL Gomes, TR Cunha, JC Pedro IEEE Transactions on Microwave Theory and Techniques 69 (1), 529-540, 2020 | 15 | 2020 |
| A Review of Memory Effects in AlGaN/GaN HEMT Based RF PAs J Pedro, P Tomé, T Cunha, F Barradas, L Nunes, P Cabral, J Gomes 2021 IEEE MTT-S International Wireless Symposium (IWS), 1-3, 2021 | 13 | 2021 |
| Explaining the Different Time Constants Extracted from Low Frequency Y22 and -DLTS on GaN HEMTs JL Gomes, LC Nunes, JC Pedro 2020 IEEE/MTT-S International Microwave Symposium (IMS), 432-435, 2020 | 9 | 2020 |
| Transient Pulsed S-Parameters for Trapping Characterization JL Gomes, LC Nunes, JC Pedro 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre …, 2020 | 6 | 2020 |
| A Simple Thermally Activated Trapping Model for AlGaN/GaN HEMTs LC Nunes, JL Gomes, FM Barradas, JC Pedro 2022 52th European Microwave Conference (EuMC), 2022 | 5 | 2022 |
| Memristive Properties of GaN HEMTs Containing Deep‐Level Traps JL Gomes, LC Nunes, NA Sobolev, JC Pedro physica status solidi (b) 256 (5), 1800387, 2019 | 5 | 2019 |
| A transient two-tone RF method for the characterization of electron trapping capture and emission dynamics in GaN HEMTs PM Tomé, FM Barradas, LC Nunes, JL Gomes, TR Cunha, JC Pedro 2020 IEEE/MTT-S International Microwave Symposium (IMS), 428-431, 2020 | 4 | 2020 |
| Deep-level traps’ capture time constant and its impact on nonlinear GaN HEMT modeling JL Gomes, LC Nunes, CF Gonçalves, JC Pedro 2018 International Workshop on Integrated Nonlinear Microwave and Millimetre …, 2018 | 4 | 2018 |
| On the Energy Nonconservation in the FET’s Equivalent Circuit Capacitance Model JL Gomes, FM Barradas, LC Nunes, JC Pedro IEEE Transactions on Electron Devices, 2023 | 2 | 2023 |
| Electro-Thermal and Trapping Characterization of AlGaN/GaN RF Power HEMTs J Pedro, J Gomes, L Nunes 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021 | 2 | 2021 |
| On the Drain-to-Source Capacitance of Microwave FETs in Triode Region JL Gomes, LC Nunes, JC Pedro 2022 IEEE/MTT-S International Microwave Symposium-IMS 2022, 333-335, 2022 | 1 | 2022 |
| A Qualitative Explanation of the AlGaN/GaN HEMT Nonlinear Intrinsic Capacitances JL Gomes, LC Nunes, FM Barradas, JC Pedro 2022 International Workshop on Integrated Nonlinear Microwave and Millimetre …, 2022 | 1 | 2022 |
| A New Vision of the Role Played by Buffer Dopants on the Operation of AlGaN/GaN HEMTs AS Alavijeh, JL Gomes, LC Nunes, JC Pedro 2023 International Workshop on Integrated Nonlinear Microwave and Millimetre …, 2023 | | 2023 |
| A Simple Method to Extract the Thermal Resistance of GaN HEMTs from De-trapping Characteristics B González, LC Nunes, JL Gomes, JC Mendes, JL Jimenez IEEE Electron Device Letters, 2023 | | 2023 |
| AlGaN/GaN HEMT TRAP CHARACTERISTIC FREQUENCY DEPENDENCE ON TEMPERATURE AND ITS IMPACT ON THE RF POWER AMPLIFIER LINEARIZABILITY JL Gomes, LC Nunes, JC Pedro Математическое моделирование в материаловедении электронных компонентов, 104-107, 2021 | | 2021 |
| CONSISTENT MODELINGOF DC AND AC CHARACTERISTICS OF GaN/AlGaN MICROWAVE POWER HEMTS JC Pedro, JL Gomes, LC Nunes Математическое моделирование в материаловедении электронных компонентов, 106-109, 2020 | | 2020 |
| Memristive properties in GaN HEMTs affected by deep-level traps JLL Gomes Universidade de Aveiro, 2017 | | 2017 |
L. C. NunesResearch Assistant at Universidade de Aveiro在 ua.pt 的电子邮件经过验证
