| Enabling IC traceability via blockchain pegged to embedded PUF MN Islam, S Kundu ACM Transactions on Design Automation of Electronic Systems (TODAES) 24 (3 …, 2019 | 81 | 2019 |
| On IC traceability via blockchain MN Islam, VC Patii, S Kundu 2018 International symposium on VLSI design, automation and test (VLSI-DAT), 1-4, 2018 | 60 | 2018 |
| Preserving IoT privacy in sharing economy via smart contract MN Islam, S Kundu 2018 IEEE/ACM Third International Conference on Internet-of-Things Design …, 2018 | 36 | 2018 |
| Privacy in blockchain-enabled iot devices A Pouraghily, MN Islam, S Kundu, T Wolf 2018 IEEE/ACM Third International Conference on Internet-of-Things Design …, 2018 | 31 | 2018 |
| IoT security, privacy and trust in home-sharing economy via blockchain MN Islam, S Kundu Blockchain Cybersecurity, Trust and Privacy, 33-50, 2020 | 21 | 2020 |
| On enhancing reliability of weak PUFs via intelligent post-silicon accelerated aging MN Islam, VC Patil, S Kundu IEEE Transactions on Circuits and Systems I: Regular Papers 65 (3), 960-969, 2017 | 21 | 2017 |
| PMU-Trojan: On exploiting power management side channel for information leakage MN Islam, S Kundu 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 709-714, 2018 | 17 | 2018 |
| Determining proximal geolocation of IoT edge devices via covert channel MN Islam, VC Patil, S Kundu 2017 18th International Symposium on Quality Electronic Design (ISQED), 196-202, 2017 | 13 | 2017 |
| Remote configuration of integrated circuit features and firmware management via smart contract MN Islam, S Kundu 2019 IEEE International Conference on Blockchain (Blockchain), 325-331, 2019 | 10 | 2019 |
| A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF MN Islam, VC Patil, S Kundu 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017 | 10 | 2017 |
| Remote device management via smart contracts MN Islam, S Kundu IEEE Transactions on Consumer Electronics 68 (1), 38-46, 2021 | 9 | 2021 |
| An analytical model for predicting the residual life of an IC and design of residual-life meter MN Islam, S Kundu 2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017 | 6 | 2017 |
| Based Stored Charge Modeling of Insulated Gate Bipolar Transistor A Das, MM Haq, MN Islam, MZR Khan International Journal of Engineering Innovation & Research 4 (2), 248-252, 2015 | 5 | 2015 |
| Enabling IoT authentication, privacy and security via blockchain MN Islam | 4 | 2021 |
| Modeling residual lifetime of an ic considering spatial and inter-temporal temperature variations MN Islam, S Kundu 2016 IEEE 25th Asian Test Symposium (ATS), 240-245, 2016 | 4 | 2016 |
| Transient anode voltage modeling of IGBT and its carrier lifetime dependence A Das, N Islam, M Haq, ZR Khan TENCON 2015-2015 IEEE Region 10 Conference, 1-5, 2015 | 3 | 2015 |
| Minority carrier lifetime profile into switching analysis of IGBT through parabolic approximation A Das, MN Islam, MM Haq, MZR Khan 2016 5th International Conference on Informatics, Electronics and Vision …, 2016 | 2 | 2016 |
| Modeling residual life of an ic considering multiple aging mechanisms MN Islam, S Kundu 2016 IEEE 25th North Atlantic Test Workshop (NATW), 24-27, 2016 | 2 | 2016 |
| A Software Approach Towards Defeating Power Management Side Channel Leakage MN Islam, S Kundu 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 1 | 2022 |
Sandip KunduUniversity of Massachusetts在 ecs.umass.edu 的电子邮件经过验证
