| Secondary electron emission on space materials: Evaluation of the total secondary electron yield from surface potential measurements N Balcon, D Payan, M Belhaj, T Tondu, V Inguimbert IEEE Transactions on Plasma Science 40 (2), 282-290, 2011 | 161 | 2011 |
| Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods M Belhaj, O Jbara, MN Filippov, EI Rau, MV Andrianov Applied surface science 177 (1-2), 58-65, 2001 | 76 | 2001 |
| Time-dependent measurement of the trapped charge in electron irradiated insulators: Application to –sapphire M Belhaj, S Odof, K Msellak, O Jbara Journal of Applied Physics 88 (5), 2289-2294, 2000 | 63 | 2000 |
| Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for … O Jbara, M Belhaj, S Odof, K Msellak, EI Rau, MV Andrianov Review of Scientific Instruments 72 (3), 1788-1795, 2001 | 57 | 2001 |
| Radiation induced conductivity in space dielectric materials R Hanna, T Paulmier, P Molinié, M Belhaj, B Dirassen, D Payan, N Balcon Journal of Applied Physics 115 (3), 2014 | 55 | 2014 |
| An anomalous contrast in scanning electron microscopy of insulators: The pseudo‐mirror effect M Belhaj, O Jbara, S Odof, K Msellak, EI Rau, MV Andrianov Scanning 22 (6), 352-356, 2000 | 54 | 2000 |
| An experimental approach for dynamic investigation of the trapping properties of glass-ceramic under electron beam irradiation from a scanning electron microscope S Fakhfakh, O Jbara, M Belhaj, Z Fakhfakh, A Kallel, EI Rau The European Physical Journal-Applied Physics 21 (2), 137-146, 2003 | 47 | 2003 |
| Role of the different chemical components in the conditioning process of air exposed copper surfaces V Petit, M Taborelli, H Neupert, P Chiggiato, M Belhaj Physical Review Accelerators and Beams 22 (8), 083101, 2019 | 46 | 2019 |
| Investigation of the electron emission properties of silver: From exposed to ambient atmosphere Ag surface to ion-cleaned Ag surface T Gineste, M Belhaj, G Teyssedre, J Puech Applied Surface Science 359, 398-404, 2015 | 44 | 2015 |
| Charge implantation measurement on electron-irradiated insulating materials by means of a SEM technique O Jbara, S Fakhfakh, M Belhaj, S Rondot Microscopy and Microanalysis 10 (6), 697-710, 2004 | 42 | 2004 |
| The study of electron emission from aluminum in the very low primary energy range using Monte Carlo simulations J Roupie, O Jbara, T Tondu, M Belhaj, J Puech Journal of Physics D: Applied Physics 46 (12), 125306, 2013 | 38 | 2013 |
| Experimental investigation of the effect of the internal space charge accumulation on the electron emission yield of insulators submitted to e-irradiation: application to … M Belhaj, T Tondu, V Inguimbert Journal of Physics D: Applied Physics 42 (14), 145306, 2009 | 36 | 2009 |
| Charging effects of PET under electron beam irradiation in a SEM O Jbara, S Fakhfakh, M Belhaj, S Rondot, A Hadjadj, JM Patat Journal of Physics D: Applied Physics 41 (24), 245504, 2008 | 36 | 2008 |
| Polyimide and FEP charging behavior under multienergetic electron-beam irradiation P Molinie, P Dessante, R Hanna, T Paulmier, B Dirassen, M Belhaj, ... IEEE Transactions on Dielectrics and Electrical Insulation 19 (4), 1215-1220, 2012 | 34 | 2012 |
| The effects of incident electron current density and temperature on the total electron emission yield of polycrystalline CVD diamond M Belhaj, T Tondu, V Inguimbert, P Barroy, F Silva, A Gicquel Journal of Physics D: Applied Physics 43 (13), 135303, 2010 | 34 | 2010 |
| A Kelvin probe based method for measuring the electron emission yield of insulators and insulated conductors subjected to electron irradiation M Belhaj, T Tondu, V Inguimbert, JP Chardon Journal of Physics D: Applied Physics 42 (10), 105309, 2009 | 34 | 2009 |
| Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms S Fakhfakh, O Jbara, M Belhaj, Z Fakhfakh, A Kallel, EI Rau Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 34 | 2002 |
| A new experimental approach for characterizing the internal trapped charge and electric field build up in ground-coated insulators during their e− irradiation O Jbara, S Fakhfakh, M Belhaj, J Cazaux, EI Rau, M Filippov, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 32 | 2002 |
| Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si J Pierron, C Inguimbert, M Belhaj, T Gineste, J Puech, M Raine Journal of Applied Physics 121 (21), 2017 | 31 | 2017 |
| Multipactor threshold sensitivity to total electron emission yield in small gap waveguide structure and TEEY models accuracy N Fil, M Belhaj, J Hillairet, J Puech Physics of Plasmas 23 (12), 2016 | 31 | 2016 |
