| Liquid crystal display having stripe-shaped common electrodes formed above plate-shaped pixel electrodes YH Tai, L Chuang, CH Chen US Patent App. 09/444,141, 2001 | 3727 | 2001 |
| Apparatus and method of testing an organic light emitting diode array YH Tai, YE Chen US Patent 6,433,485, 2002 | 156 | 2002 |
| Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress YC Chen, TC Chang, HW Li, SC Chen, J Lu, WF Chung, YH Tai, ... Applied Physics Letters 96 (26), 2010 | 152 | 2010 |
| Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors WF Chung, TC Chang, HW Li, SC Chen, YC Chen, TY Tseng, YH Tai Applied Physics Letters 98 (15), 2011 | 96 | 2011 |
| The deterioration of a-IGZO TFTs owing to the copper diffusion after the process of the source/drain metal formation YH Tai, HL Chiu, LS Chou Journal of the Electrochemical Society 159 (5), J200, 2012 | 85 | 2012 |
| Influence of H2O dipole on subthreshold swing of amorphous indium–gallium–zinc-oxide thin film transistors WF Chung, TC Chang, HW Li, CW Chen, YC Chen, SC Chen, TY Tseng, ... Electrochemical and Solid-State Letters 14 (3), H114, 2010 | 81 | 2010 |
| Characteristics and mechanisms of silicon-oxide-based resistance random access memory KC Chang, TM Tsai, TC Chang, HH Wu, JH Chen, YE Syu, GW Chang, ... IEEE electron device letters 34 (3), 399-401, 2013 | 75 | 2013 |
| A new pixel circuit for driving organic light-emitting diode with low temperature polycrystalline silicon thin-film transistors YH Tai, BT Chen, YJ Kuo, CC Tsai, KY Chiang, YJ Wei, HC Cheng Journal of Display Technology 1 (1), 100, 2005 | 75 | 2005 |
| Charge quantity influence on resistance switching characteristic during forming process TJ Chu, TC Chang, TM Tsai, HH Wu, JH Chen, KC Chang, TF Young, ... IEEE Electron Device Letters 34 (4), 502-504, 2013 | 69 | 2013 |
| Novel gate-all-around poly-Si TFTs with multiple nanowire channels TC Liao, SW Tu, HY Ming, WK Lin, CC Liu, KJ Chang, YH Tai, HC Cheng IEEE electron device letters 29 (8), 889-891, 2008 | 63 | 2008 |
| MiR‐99a exerts anti‐metastasis through inhibiting myotubularin‐related protein 3 expression in oral cancer YZ Kuo, YH Tai, HI Lo, YL Chen, HC Cheng, WY Fang, SH Lin, CL Yang, ... Oral diseases 20 (3), e65-e75, 2014 | 60 | 2014 |
| High-performance polycrystalline silicon thin-film transistor with multiple nanowire channels and lightly doped drain structure YC Wu, TC Chang, CY Chang, CS Chen, CH Tu, PT Liu, HW Zan, YH Tai Applied physics letters 84 (19), 3822-3824, 2004 | 60 | 2004 |
| Origin of hopping conduction in graphene-oxide-doped silicon oxide resistance random access memory devices KC Chang, R Zhang, TC Chang, TM Tsai, JC Lou, JH Chen, TF Young, ... IEEE electron device letters 34 (5), 677-679, 2013 | 59 | 2013 |
| Silicon introduced effect on resistive switching characteristics of WOX thin films YE Syu, TC Chang, TM Tsai, GW Chang, KC Chang, YH Tai, MJ Tsai, ... Applied Physics Letters 100 (2), 2012 | 57 | 2012 |
| A tumor DNA complex aberration index is an independent predictor of survival in breast and ovarian cancer HKM Vollan, OM Rueda, SF Chin, C Curtis, G Turashvili, S Shah, ... Molecular oncology 9 (1), 115-127, 2015 | 52 | 2015 |
| Bipolar resistive RAM characteristics induced by nickel incorporated into silicon oxide dielectrics for IC applications TM Tsai, KC Chang, TC Chang, YE Syu, SL Chuang, GW Chang, GR Liu, ... IEEE electron device letters 33 (12), 1696-1698, 2012 | 52 | 2012 |
| A distributed charge storage with nanodots TC Chang, ST Yan, CH Hsu, MT Tang, JF Lee, YH Tai, PT Liu, SM Sze Applied physics letters 84 (14), 2581-2583, 2004 | 52 | 2004 |
| Origin of Hopping Conduction in Sn-Doped Silicon Oxide RRAM With SupercriticalFluid Treatment TM Tsai, KC Chang, TC Chang, GW Chang, YE Syu, YT Su, GR Liu, ... IEEE electron device letters 33 (12), 1693-1695, 2012 | 48 | 2012 |
| Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress GW Chang, TC Chang, JC Jhu, TM Tsai, YE Syu, KC Chang, YH Tai, ... Applied Physics Letters 100 (18), 2012 | 47 | 2012 |
| A new pixel circuit compensating for brightness variation in large size and high resolution AMOLED displays HY Lu, TC Chang, YH Tai, PT Liu, S Chi Journal of Display Technology 3 (4), 398-403, 2007 | 46 | 2007 |
