GLU3. 0: Fast GPU-based parallel sparse LU factorization for circuit simulation S Peng, SXD Tan IEEE Design & Test 37 (3), 78-90, 2020 | 40 | 2020 |
Fast analytic electromigration analysis for general multisegment interconnect wires L Chen, SXD Tan, Z Sun, S Peng, M Tang, J Mao IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (2), 421-432, 2019 | 26 | 2019 |
A fast semi-analytic approach for combined electromigration and thermomigration analysis for general multisegment interconnects L Chen, SXD Tan, Z Sun, S Peng, M Tang, J Mao IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 20 | 2020 |
EMGraph: Fast learning-based electromigration analysis for multi-segment interconnect using graph convolution networks W Jin, L Chen, S Sadiqbatcha, S Peng, SXD Tan 2021 58th ACM/IEEE Design Automation Conference (DAC), 919-924, 2021 | 17 | 2021 |
Data-driven electrostatics analysis based on physics-constrained deep learning W Jin, S Peng, SXD Tan 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021 | 10 | 2021 |
Physics-Based Compact TDDB Models for Low- BEOL Copper Interconnects With Time-Varying Voltage Stressing S Peng, H Zhou, T Kim, HB Chen, SXD Tan IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (2), 239-248, 2017 | 9 | 2017 |
Runtime long-term reliability management using stochastic computing in deep neural networks Y Liu, S Yu, S Peng, SXD Tan 2021 22nd International Symposium on Quality Electronic Design (ISQED), 553-558, 2021 | 5 | 2021 |
Full-chip wire-oriented back-end-of-line TDDB hotspot detection and lifetime analysis S Peng, E Demircan, MD Shroff, SXD Tan Integration 70, 90-98, 2020 | 5 | 2020 |
Data-driven fast electrostatics and TDDB aging analysis S Peng, W Jin, L Chen, SXD Tan Proceedings of the 2020 ACM/IEEE Workshop on Machine Learning for CAD, 71-76, 2020 | 4 | 2020 |
Run-time accuracy reconfigurable stochastic computing for dynamic reliability and power management: Work-in-progress S Yu, H Zhou, S Peng, H Amrouch, J Henkel, SXD Tan 2020 International Conference on Compilers, Architecture, and Synthesis for …, 2020 | 1 | 2020 |
Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management S Yu, H Zhou, S Peng, H Amrouch, J Henkel, SXD Tan arXiv preprint arXiv:2004.13320, 2020 | 1 | 2020 |
Long-Term Reliability Management For Multitasking GPGPUs Z Sun, T Kim, M Chow, S Peng, H Zhou, H Kim, D Wong, SXD Tan 2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019 | 1 | 2019 |
EMGraph: Fast electromigration stress assessment for interconnect trees using graph convolution networks W Jin, L Chen, S Sadiqbatch, S Peng, SXD Tan Proc. IEEE/ACM Design Automation Conference (DAC’21), 2021 | | 2021 |
Modeling and Simulation Methods for VLSI Interconnect Reliability Focusing on Time Dependent Dielectric Breakdown S Peng University of California, Riverside, 2021 | | 2021 |
Multi-Thread Assembling for Fast FEM Power Delivery DC Integrity Analysis K Yang, S Peng, SXD Tan, HB Chen 2019 IEEE 13th International Conference on ASIC (ASICON), 1-4, 2019 | | 2019 |