| Bridging defects resistance measurements in a CMOS process R Rodríguez-Montañés, E Bruis, J Figueras Proceedings International Test Conference 1992, 892, 1995 | 243 | 1995 |
| Resistance characterization for weak open defects RR Montañés, JP De Gyvez, P Volf IEEE Design & Test of Computers 19 (5), 18-26, 2002 | 198 | 2002 |
| Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS R Rodríguez-Montañés, JA Segura, VH Champac, J Figueras, JA Rubio 1991, Proceedings. International Test Conference, 510, 1991 | 109 | 1991 |
| Experimental characterization of CMOS interconnect open defects D Arumi, R Rodriguez-Montanes, J Figueras IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007 | 77 | 2007 |
| The low area probing detector as a countermeasure against invasive attacks M Weiner, S Manich, R Rodríguez-Montañés, G Sigl IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (2), 392-403, 2017 | 56 | 2017 |
| Quiescent current analysis and experimentation of defective CMOS circuits JA Segura, VH Champac, R Rodriguez-Montanes, J Figueras, JA Rubio Journal of Electronic Testing 3, 337-348, 1992 | 55 | 1992 |
| Analysis of bridging defects in sequential CMOS circuits and their current testability R Rodríguez-Montañés, J Figueras Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC, 356-360, 1994 | 38 | 1994 |
| Diagnosis of full open defects in interconnecting lines R Rodríguez-Montañés, D Arumi, J Figueras, S Einchenberger, C Hora, ... 25th IEEE VLSI Test Symposium (VTS'07), 158-166, 2007 | 37 | 2007 |
| Unpredictable bits generation based on RRAM parallel configuration D Arumí, Á Gómez-Pau, S Manich, R Rodríguez-Montañés, MB González, ... IEEE Electron Device Letters 40 (2), 341-344, 2018 | 36 | 2018 |
| Bridging defects resistance in the metal layer of a CMOS process R Rodríguez-Montañés, E Bruls, J Figueras Journal of Electronic Testing 8 (1), 35-46, 1996 | 28 | 1996 |
| Current vs. logic testability of bridges in scan chains R Rodriguez-Montanes, J Figueras, A Rubio Proceedings ETC 93 Third European Test Conference, 392-396, 1993 | 28 | 1993 |
| Backside polishing detector: a new protection against backside attacks S Manich Bou, D Arumi Delgado, R Rodríguez Montañés, J Mujal Colell, ... DCIS'15-XXX Conference on Design of Circuits and Integrated Systems, 2015 | 25 | 2015 |
| Prebond testing of weak defects in TSVs D Arumí, R Rodríguez-Montañés, J Figueras IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (4 …, 2015 | 23 | 2015 |
| Post-bond test of Through-Silicon Vias with open defects R Rodríguez-Montañés, D Arumí, J Figueras 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 21 | 2014 |
| Full open defects in nanometric CMOS D Arumí, R Rodríguez-Montañés, J Figueras, S Eichenberger, C Hora, ... 26th IEEE VLSI Test Symposium (vts 2008), 119-124, 2008 | 21 | 2008 |
| Una propuesta de evaluación de competencias genéricas en grados de Ingeniería M Martínez Martínez, B Amante García, A Cadenato Matía, ... REDU. Revista de Docencia Universitaria 11, 113-139, 2013 | 19 | 2013 |
| Diagnosis of bridging defects based on current signatures at low power supply voltages D Arumi, R Rodríguez-Montañés, J Figueras, S Eichenberger, C Hora, ... 25th IEEE VLSI Test Symposium (VTS'07), 145-150, 2007 | 18 | 2007 |
| Gate leakage impact on full open defects in interconnect lines D Arumi, R Rodriguez-Montanes, J Figueras, S Eichenberger, C Hora, ... IEEE transactions on very large scale integration (VLSI) systems 19 (12 …, 2010 | 17 | 2010 |
| RRAM based random bit generation for hardware security applications D Arumí, S Manich, R Rodríguez-Montañés, M Pehl 2016 Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2016 | 16 | 2016 |
| Impact of gate tunnelling leakage on CMOS circuits with full open defects R Rodríguez Montañés, D Arumi Delgado, J Figueras Pàmies, ... Electronics letters 43 (21), 1140-1141, 2007 | 16 | 2007 |
