Secure scan and test using obfuscation throughout supply chain X Wang, D Zhang, M He, D Su, M Tehranipoor IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 115 | 2017 |
Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain D Zhang, M He, X Wang, M Tehranipoor 2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017 | 46 | 2017 |
AES Design Improvements Towards Information Security Considering Scan Attack L Yu, D Zhang, L Wu, S Xie, D Su, X Wang 2018 17th IEEE International Conference On Trust, Security And Privacy In …, 2018 | 28 | 2018 |
An On-Chip Dynamically Obfuscated Wrapper for Protecting Supply Chain Against IP and IC Piracies D Zhang, X Wang, MT Rahman, M Tehranipoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (11 …, 2018 | 25 | 2018 |
A novel peak power supply noise measurement and adaptation system for integrated circuits X Wang, D Zhang, D Su, L Winemberg, M Tehranipoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (5 …, 2016 | 21 | 2016 |
DOST: Dynamically obfuscated wrapper for split test against IC piracy X Wang, Y Guo, T Ramhan, D Zhang, M Tehranipoor 2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), 1-6, 2017 | 14 | 2017 |
A Novel Authentication Methodology to Detect Counterfeit PCB Using PCB Trace-Based Ring Oscillator D Zhang, Q Ren, D Su IEEE Access 9, 28525-28539, 2021 | 11 | 2021 |
A Novel Authorization Methodology to Prevent Counterfeit PCB/Equipment through Supply Chain D Zhang, Y Han, Q Ren 2019 IEEE 4th International Conference on Integrated Circuits and …, 2019 | 7 | 2019 |
An on-chip binning sensor for low-cost and accurate speed binning D Zhang, X Wang 2017 2nd IEEE International Conference on Integrated Circuits and …, 2017 | 6 | 2017 |
All-spin PUF: An Area-efficient and Reliable PUF Design with Signature Improvement for Spin-transfer Torque Magnetic Cell-based All-spin Circuits K Xu, D Zhang, Q Ren, Y Cheng, P Girard ACM Journal on Emerging Technologies in Computing Systems (JETC) 18 (4), 1-20, 2022 | 2 | 2022 |
An On-chip Path Delay Measurement Sensor for Aging Monitoring D Zhang, Q Ren, D Su 2021 IEEE 14th International Conference on ASIC (ASICON), 1-4, 2021 | 2 | 2021 |
Design of a Network of Digital Sensor Macros for Extracting Power Supply Noise Profile in SoCs.................... M Sadi, M Tehranipoor, X Wang, D Zhang, D Su, L Winemberg, D Arumí, ... Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, 1-13, 2016 | 1 | 2016 |
Analytical Models of On-chip Hardware Trojan Detection based on Radiated Emission Characteristics F ZHANG, D ZHANG, Q REN, A CHEN, D SU Chinese Journal of Electronics 32, 1-9, 2022 | | 2022 |
A Novel All-Digital on-Chip Aging Sensor Robust to Process Variations C Wei, D Zhang, Q Ren, D Su 2022 7th International Conference on Integrated Circuits and Microsystems …, 2022 | | 2022 |
Hardware Trojan Recognition based on Radiated Emission Characteristics F Zhang, D Zhang, Z Peng, Q Ren, A Chen, D Su 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2022 | | 2022 |
A Novel Dual Logic Locking Method to Prevent Counterfeit IP/IC A Cui, D Zhang, Q Ren, D Su 2022 IEEE International Test Conference in Asia (ITC-Asia), 79-84, 2022 | | 2022 |