| System-in-package testing: problems and solutions D Appello, P Bernardi, M Grosso, MS Reorda IEEE Design & Test of Computers 23 (3), 203-211, 2006 | 56 | 2006 |
| The energy efficiency management at urban scale by means of integrated modelling A Ronzino, A Osello, E Patti, L Bottaccioli, C Danna, A Lingua, ... Energy Procedia 83, 258-268, 2015 | 36 | 2015 |
| On the use of embedded debug features for permanent and transient fault resilience in microprocessors M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ... Microprocessors and Microsystems 36 (5), 334-343, 2012 | 33 | 2012 |
| Fault grading of software-based self-test procedures for dependable automotive applications P Bernardi, M Grosso, E Sánchez, O Ballan 2011 Design, Automation & Test in Europe, 1-2, 2011 | 33 | 2011 |
| A programmable BIST for DRAM testing and diagnosis P Bernardi, M Grosso, MS Reorda, Y Zhang 2010 IEEE International Test Conference, 1-10, 2010 | 31 | 2010 |
| On-line software-based self-test of the address calculation unit in RISC processors P Bernardi, L Ciganda, M de Carvalho, M Grosso, J Lagos-Benites, ... 2012 17th IEEE European Test Symposium (ETS), 1-6, 2012 | 30 | 2012 |
| A novel sbst generation technique for path-delay faults in microprocessors exploiting gate-and rt-level descriptions K Christou, MK Michael, P Bernardi, M Grosso, E Sánchez, MS Reorda 26th IEEE VLSI Test Symposium (vts 2008), 389-394, 2008 | 30 | 2008 |
| An on-line fault detection technique based on embedded debug features M Grosso, MS Reorda, M Portela-Garcia, M García-Valderas, ... 2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010 | 29 | 2010 |
| A pattern ordering algorithm for reducing the size of fault dictionaries P Bernardi, M Grosso, M Rebaudengo, MS Reorda 24th IEEE VLSI Test Symposium, 6 pp.-391, 2006 | 28 | 2006 |
| Embedded memory diagnosis: An industrial workflow D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 2006 IEEE International Test Conference, 1-9, 2006 | 27 | 2006 |
| A top-down constraint-driven methodology for smart system design M Crepaldi, M Grosso, A Sassone, S Gallinaro, S Rinaudo, M Poncino, ... IEEE Circuits and Systems Magazine 14 (1), 37-57, 2014 | 26 | 2014 |
| Integrating BIST techniques for on-line SoC testing A Manzone, P Bernardi, M Grosso, M Rebaudengo, E Sánchez, ... 11th IEEE International On-Line Testing Symposium, 235-240, 2005 | 25 | 2005 |
| Smart electronic systems: an overview A Sassone, M Grosso, M Poncino, E Macii Smart Systems Integration and Simulation, 5-21, 2016 | 24 | 2016 |
| Energy-efficient battery charging in electric vehicles with solar panels M Grosso, D Lena, A Bocca, A Macii, S Rinaudo 2016 IEEE 2nd International Forum on Research and Technologies for Society …, 2016 | 23 | 2016 |
| On the automation of the test flow of complex SoCs D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 24th IEEE VLSI Test Symposium, 6 pp.-171, 2006 | 23 | 2006 |
| On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ... 2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013 | 22 | 2013 |
| A hybrid approach for detection and correction of transient faults in SoCs P Bernardi, LB Poehls, M Grosso, MS Reorda IEEE Transactions on Dependable and Secure Computing 7 (4), 439-445, 2010 | 21 | 2010 |
| On the automatic generation of test programs for path-delay faults in microprocessor cores P Bernardi, M Grosso, E Sánchez, MS Reorda 12th IEEE European Test Symposium (ETS'07), 179-184, 2007 | 17 | 2007 |
| Exploiting fault model correlations to accelerate SEU sensitivity assessment M Grosso, H Guzman-Miranda, MA Aguirre IEEE Transactions on Industrial Informatics 9 (1), 142-148, 2012 | 15 | 2012 |
| Evaluating alpha-induced soft errors in embedded microprocessors P Rech, S Gerardin, A Paccagnella, P Bernardi, M Grosso, MS Reorda, ... 2009 15th IEEE International On-Line Testing Symposium, 69-74, 2009 | 15 | 2009 |
Matteo SONZA REORDAPolitecnico di Torino, Dept. of Control and Computer Engineering在 polito.it 的电子邮件经过验证
