| An improved grey-based approach for early manufacturing data forecasting DC Li, CW Yeh, CJ Chang Computers & Industrial Engineering 57 (4), 1161-1167, 2009 | 106 | 2009 |
| A non-parametric learning algorithm for small manufacturing data sets DC Li, CW Yeh Expert systems with applications 34 (1), 391-398, 2008 | 59 | 2008 |
| Detecting representative data and generating synthetic samples to improve learning accuracy with imbalanced data sets DC Li, SC Hu, LS Lin, CW Yeh PloS one 12 (8), e0181853, 2017 | 41 | 2017 |
| Optimal decision for warranty with consideration of marketing and production capacity CW Yeh, CC Fang International Journal of Production Research 53 (18), 5456-5471, 2015 | 35 | 2015 |
| Effective confidence interval estimation of fault-detection process of software reliability growth models CC Fang, CW Yeh International Journal of Systems Science 47 (12), 2878-2892, 2016 | 27 | 2016 |
| Acquiring knowledge with limited experience DC Li, CW Yeh, TI Tsai, YH Fang, SC Hu Expert Systems 24 (3), 162-170, 2007 | 18 | 2007 |
| A learning approach with under-and over-sampling for imbalanced data sets CW Yeh, DC Li, LS Lin, TI Tsai 2016 5Th IIAI international congress on advanced applied informatics (IIAI …, 2016 | 17 | 2016 |
| A case study: The prediction of Taiwan’s export of polyester fiber using small-data-set learning methods DC Li, CW Yeh, ZY Li Expert Systems with Applications 34 (3), 1983-1994, 2008 | 12 | 2008 |
| An integrated producer–buyer supply chain with delivery cost under stochastic transportation time YC Fu, CW Yeh Applied Mathematical Modelling 44, 676-687, 2017 | 10 | 2017 |
| Confidence interval estimation of software reliability growth models derived from stochastic differential equations CC Fang, CW Yeh 2011 IEEE International Conference on Industrial Engineering and Engineering …, 2011 | 10 | 2011 |
| Optimal pro-rata warranty decision with consideration of the marketing strategy under insufficient historical reliability data CW Yeh, CC Fang The International Journal of Advanced Manufacturing Technology 71, 1757-1772, 2014 | 9 | 2014 |
| Estimation of a data-collection maturity model to detect manufacturing change CW Yeh, DC Li, YR Zhang Expert Systems with Applications 39 (8), 7093-7101, 2012 | 8 | 2012 |
| Bayesian software reliability prediction based on Yamada delayed S-shaped model TQ Lee, CW Yeh, CC Fang Applied Mechanics and Materials 490, 1267-1278, 2014 | 7 | 2014 |
| Software release assessment under multiple alternatives with consideration of debuggers’ learning rate and imperfect debugging environment Q Tian, CC Fang, CW Yeh Mathematics 10 (10), 1744, 2022 | 6 | 2022 |
| Confidence interval estimation of software reliability growth models based on ohba’s inflection s-shaped model TQ Lee, CC Fang, CW Yeh Journal of Industrial and Intelligent Information Vol 1 (4), 2013 | 6 | 2013 |
| Bayesian Decision Making of an Imperfect Debugging Software Reliability Growth Model with Consideration of Debuggers’ Learning and Negligence Factors Q Tian, CW Yeh, CC Fang Mathematics 10 (10), 1689, 2022 | 4 | 2022 |
| A new grey prediction model for the return material authorization process in the TFT-LCD industry DC Li, CW Yeh, CC Chen, YT Wang The International Journal of Advanced Manufacturing Technology 96, 2149-2160, 2018 | 4 | 2018 |
| Impacts of Transportation Cost on Distribution‐Free Newsboy Problems MH Shu, CW Yeh, YC Fu Mathematical Problems in Engineering 2014 (1), 307935, 2014 | 4 | 2014 |
| Using a diffusion wavelet neural network for short-term time series learning in the wafer level chip scale package process DC Li, CW Yeh, CC Chen, HT Shih Journal of Intelligent Manufacturing 27, 1261-1272, 2016 | 3 | 2016 |
| A Modified Grey Prediction Method to Early Manufacturing Data Sets CW Yeh, CJ Chang, DC Li Proceedings of the International MultiConference of Engineers and Computer …, 2009 | 3 | 2009 |
