| SiGe/Si hetero nanotube JLFET for improved performance: proposal and investigation A Thakur, R Dhiman Electronics Letters 55 (25), 1359-1361, 2019 | 16 | 2019 |
| Impacts of core gate thickness and Ge content variation on the performance of Si1−xGex source/drain Si–nanotube JLFET A Thakur, R Dhiman Journal of Computational Electronics 20, 237-247, 2021 | 12 | 2021 |
| Highly sensitive N+ pocket doped vertical tunnel FET biosensor with wide range work function modulation gate electrodes G Wadhwa, J Singh, A Thakur, S Bhandari Materials Science and Engineering: B 297, 116730, 2023 | 10 | 2023 |
| A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement A Thakur, R Dhiman Microelectronics Journal 126, 105501, 2022 | 7 | 2022 |
| Design and performance analysis of SiGe hetero nanotube junctionless FET A Thakur, R Dhiman TENCON 2019-2019 IEEE Region 10 Conference (TENCON), 2424-2427, 2019 | 7 | 2019 |
| Temperature assessment of Si1-xGex source/drain heterojunction NT-JLFET for gate induced drain leakage‒A compact model A Thakur, R Dhiman Superlattices and Microstructures 156, 106961, 2021 | 4 | 2021 |
| Comprehensive study of gate induced drain leakage in nanowire and nanotube junctionless FETs using Si1-xGex source/drain A Thakur, R Dhiman AEU-International Journal of Electronics and Communications 167, 154668, 2023 | 3 | 2023 |
| Parameteric optimization of SiGe S/D NT JLFET using analytical modeling to improve L‐BTBT induced GIDL A Thakur, R Dhiman, G Wadhwa, S Bhandari International Journal of Numerical Modelling: Electronic Networks, Devices …, 2024 | | 2024 |
| Investigation of Gate Induced Drain Leakage in Nanotube and Nanowire: A Comprehensive Study A Thakur, R Dhiman, G Wadhwa Nano 18 (05), 2350031, 2023 | | 2023 |
| A Temperature-Dependent Threshold Voltage Model for SiGe Source/Drain Si–NT JLFET A Thakur, R Dhiman AIJR Proceedings, 457-464, 2021 | | 2021 |
| A Threshold Voltage Model for SiGe Source/Drain Silicon-Nanotube-Based Junctionless Field-Effect Transistor A Thakur, R Dhiman Nanoscale VLSI: Devices, Circuits and Applications, 101-112, 2020 | | 2020 |
| Performance investigations in nanotube junctionless field effect transistor from gidl and reliability perspectives A Thakur Hamirpur, 0 | | |
