| SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below A Coronetti, M Cecchetto, J Wang, M Tali, PF Martinez, M Kastriotou, ... 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 1-8, 2020 | 22 | 2020 |
| Single Event Effect Testing of Commercial Silicon Power MOSFETs A Papadopoulou CERN, Democritus University of Thrace, 2020 | 3 | 2020 |
| Scattered Emission Profile Technique for Accurate and Fast Assessment of Optical Gain in Thin Film Lasing Materials N Annavarapu, I Goldberg, A Papadopoulou, K Elkhouly, J Genoe, ... ACS Photonics, 2023 | 2 | 2023 |
| SEE Testing on commercial power MOSFETs P Fernández-Martínez, A Papadopoulou, S Danzeca, G Foucard, RG Alía, ... 2020 20th European Conference on Radiation and Its Effects on Components and …, 2020 | 1 | 2020 |
| Wafer-level-integrated vertical-waveguide sub-diffraction-limited color splitters S Kang, M Benelajla, R Mac Ciamain, F Ali, A Papadopoulou, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
