| Thermal transport properties of polycrystalline tin-doped indium oxide films T Ashida, A Miyamura, N Oka, Y Sato, T Yagi, N Taketoshi, T Baba, ... Journal of applied physics 105 (7), 2009 | 159 | 2009 |
| Development of a thermal diffusivity measurement system for metal thin films using a picosecond thermoreflectance technique N Taketoshi, T Baba, A Ono Measurement Science and Technology 12 (12), 2064, 2001 | 158 | 2001 |
| Lattice thermal conductivity of MgSiO3 perovskite and post-perovskite at the core–mantle boundary K Ohta, T Yagi, N Taketoshi, K Hirose, T Komabayashi, T Baba, Y Ohishi, ... Earth and Planetary Science Letters 349, 109-115, 2012 | 132 | 2012 |
| Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement T Yagi, K Tamano, Y Sato, N Taketoshi, T Baba, Y Shigesato Journal of Vacuum Science & Technology A 23 (4), 1180-1186, 2005 | 106 | 2005 |
| Observation of heat diffusion across submicrometer metal thin films using a picosecond thermoreflectance technique NTN Taketoshi, TBT Baba, AOA Ono Japanese Journal of Applied Physics 38 (11A), L1268, 1999 | 98 | 1999 |
| Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution K Hatori, N Taketoshi, T Baba, H Ohta Review of scientific instruments 76 (11), 2005 | 92 | 2005 |
| Temperature dependence of thermal conductivity of VO2 thin films across metal–insulator transition H Kizuka, T Yagi, J Jia, Y Yamashita, S Nakamura, N Taketoshi, ... Japanese journal of applied physics 54 (5), 053201, 2015 | 89 | 2015 |
| Thermal conductivity of amorphous indium–gallium–zinc oxide thin films T Yoshikawa, T Yagi, N Oka, J Jia, Y Yamashita, K Hattori, Y Seino, ... Applied Physics Express 6 (2), 021101, 2013 | 74 | 2013 |
| Development of ultrafast laser flash methods for measuring thermophysical properties of thin films and boundary thermal resistances T Baba, N Taketoshi, T Yagi Japanese Journal of Applied Physics 50 (11S), 11RA01, 2011 | 65 | 2011 |
| Homodyne detection technique using spontaneously generated reference signal in picosecond thermoreflectance measurements N Taketoshi, T Baba, E Schaub, A Ono Review of scientific instruments 74 (12), 5226-5230, 2003 | 62 | 2003 |
| Measurements of temperature dependence of optical and thermal properties of optical disk materials M Kuwahara, O Suzuki, N Taketoshi, Y Yamakawa, T Yagi, P Fons, ... Japanese journal of applied physics 45 (2S), 1419, 2006 | 53 | 2006 |
| Electrical delay technique in the picosecond thermoreflectance method for thermophysical property measurements of thin films N Taketoshi, T Baba, A Ono Review of scientific instruments 76 (9), 2005 | 53 | 2005 |
| Thermal diffusivity measurement in a diamond anvil cell using a light pulse thermoreflectance technique T Yagi, K Ohta, K Kobayashi, N Taketoshi, K Hirose, T Baba Measurement Science and Technology 22 (2), 024011, 2010 | 51 | 2010 |
| Temperature dependence of the thermal properties of optical memory materials M Kuwahara, O Suzuki, Y Yamakawa, N Taketoshi, T Yagi, P Fons, ... Japanese journal of applied physics 46 (6S), 3909, 2007 | 51 | 2007 |
| Measurement of the thermal conductivity of nanometer scale thin films by thermoreflectance phenomenon M Kuwahara, O Suzuki, Y Yamakawa, N Taketoshi, T Yagi, P Fons, ... Microelectronic engineering 84 (5-8), 1792-1796, 2007 | 44 | 2007 |
| Thermal conductivity of hetero-epitaxial ZnO thin films on c-and r-plane sapphire substrates: Thickness and grain size effect Y Yamashita, K Honda, T Yagi, J Jia, N Taketoshi, Y Shigesato Journal of Applied Physics 125 (3), 2019 | 43 | 2019 |
| Effect of electrical properties on thermal diffusivity of amorphous indium zinc oxide films T Ashida, A Miyamura, Y Sato, T Yagi, N Taketoshi, T Baba, Y Shigesato Journal of Vacuum Science & Technology A 25 (4), 1178-1183, 2007 | 42 | 2007 |
| Thermophysical properties of aluminum oxide and molybdenum layered films N Oka, R Arisawa, A Miyamura, Y Sato, T Yagi, N Taketoshi, T Baba, ... Thin Solid Films 518 (11), 3119-3121, 2010 | 41 | 2010 |
| Thermophysical and electrical properties of Al-doped ZnO films N Oka, K Kimura, T Yagi, N Taketoshi, T Baba, Y Shigesato Journal of Applied Physics 111 (9), 2012 | 32 | 2012 |
| Development of a thermal diffusivity measurement system with a picosecond thermoreflectance technique N Taketoshi, T Baba, A Ono 計量研究所報告 46 (4), 246-253, 1997 | 32 | 1997 |
