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Yangjin Kim
Yangjin Kim
在 pusan.ac.kr 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Multiple-surface interferometry of highly reflective wafer by wavelength tuning
Y Kim, K Hibino, R Hanayama, N Sugita, M Mitsuishi
Optics Express 22 (18), 21145-21156, 2014
642014
Laser-assisted machining of zirconia ceramics using a diamond bur
T Kizaki, Y Ito, S Tanabe, Y Kim, N Sugita, M Mitsuishi
Procedia Cirp 42, 497-502, 2016
522016
Design of phase shifting algorithms: fringe contrast maximum
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics Express 22 (15), 18203-18213, 2014
522014
Simultaneous measurement of surface shape and optical thickness using wavelength tuning and a polynomial window function
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics express 23 (25), 32869-32880, 2015
382015
Surface profile measurement of a highly reflective silicon wafer by phase-shifting interferometry
Y Kim, K Hibino, N Sugita, M Mitsuishi
Applied Optics 54 (13), 4207-4213, 2015
382015
Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics Express 23 (4), 4065-4073, 2015
342015
Measurement of optical thickness variation of BK7 plate by wavelength tuning interferometry
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics express 23 (17), 22928-22938, 2015
262015
Simultaneous measurement of surface shape and absolute optical thickness of a glass plate by wavelength tuning phase-shifting interferometry
K Hibino, Y Kim, S Lee, Y Kondo, N Sugita, M Mitsuishi
Optical review 19, 247-253, 2012
242012
Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics letters 40 (13), 3169-3172, 2015
202015
Interferometric profile measurement of optical-thickness by wavelength tuning with suppression of spatially uniform error
Y Kim, K Hibino, M Mitsuishi
Optics Express 26 (8), 10870-10878, 2018
172018
Optical thickness measurement of mask blank glass plate by the excess fraction method using a wavelength-tuning interferometer
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics and Lasers in Engineering 51 (10), 1173-1178, 2013
172013
Simultaneous thickness variation and surface profiling of glass plates using Fizeau interferometer with elimination of offset phase error
W Bae, Y Kim, YH Moon, K Hibino, N Sugita, M Mitsuishi
Optics Communications 480, 126500, 2021
162021
Surface profilometry of silicon wafers using wavelength-tuned phase-shifting interferometry
F Miao, S Ahn, YH Moon, Y Kim
Journal of Mechanical Science and Technology 33, 5327-5335, 2019
162019
Error-compensating phase-shifting algorithm for surface shape measurement of transparent plate using wavelength-tuning Fizeau interferometer
Y Kim, K Hibino, N Sugita, M Mitsuishi
Optics and Lasers in Engineering 86, 309-316, 2016
162016
Phase-measuring algorithm to suppress inner reflection of transparent parallel plate in wavelength tuning Fizeau interferometer
Y Kim, N Sugita, M Mitsuishi
Precision Engineering 48, 67-74, 2017
152017
Canceling the momentum in a phase-shifting algorithm to eliminate spatially uniform errors
K Hibino, Y Kim
Applied optics 55 (23), 6331-6335, 2016
132016
Measurement of highly reflective surface shape using wavelength tuning Fizeau interferometer and polynomial window function
Y Kim, N Sugita, M Mitsuishi
Precision Engineering 45, 187-194, 2016
132016
Interferometric thickness measurement of glass plate by phase-shifting analysis using wavelength scanning with elimination of bias phase error
S Kim, Y Kim, SC Shin, K Hibino, N Sugita
Optical Review 28, 48-57, 2021
122021
Thickness profiling of transparent plate using wavelength-tuned phase-shifting analysis
Y Kim, Y Moon, K Hibino, M Mitsuishi
Measurement 161, 107870, 2020
122020
Design and assessment of phase-shifting algorithms in optical interferometer
S Kim, J Jeon, Y Kim, N Sugita, M Mitsuishi
International Journal of Precision Engineering and Manufacturing-Green …, 2023
112023
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