| Online monitoring of degradation sensitive electrical parameters in inverter operation for sic-mosfets KM Barón, K Sharma, M Nitzsche, I Kallfass 2021 IEEE Applied Power Electronics Conference and Exposition (APEC), 1235-1241, 2021 | 15 | 2021 |
| A robust approach for characterization of junction temperature of SiC power devices via quasi-threshold voltage as temperature sensitive electrical parameter K Sharma, D Dayanand, KM Barón, J Ruthardt, F Münzenmayer, ... 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), 1532-1536, 2020 | 12 | 2020 |
| Characterization of the junction temperature of SiC power devices via quasi-threshold voltage as temperature sensitive electrical parameter K Sharma, KM Baron, J Ruthardt, J Hueckelheim, D Koch, ... CIPS 2020; 11th International Conference on Integrated Power Electronics …, 2020 | 10 | 2020 |
| Online junction temperature monitoring of wide bandgap power transistors using quasi turn-on delay as TSEP K Sharma, KM Barón, J Ruthardt, I Kallfass 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021 | 8 | 2021 |
| Characterization of threshold voltage for application-oriented power cycling conditions for wide-bandgap power devices KM Baron, K Sharma, M Nitzsche, P Ziegler, D Koch, I Kallfass PCIM Europe digital days 2020; International Exhibition and Conference for …, 2020 | 7 | 2020 |
| Dynamic ac power cycling with coupled inverters operating under application-oriented conditions M Nitzsche, KM Baron, P Ziegler, F Wagner, J Roth-Stielow CIPS 2020; 11th International Conference on Integrated Power Electronics …, 2020 | 7 | 2020 |
| Online junction temperature measurement via internal gate resistance using the high frequency gate signal injection method J Ruthardt, KM Baron, P Marx, K Sharma, M Nitzsche, M Fischer, ... PCIM Europe 2019; International Exhibition and Conference for Power …, 2019 | 7 | 2019 |
| Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network K Sharma, S Kamm, KM Barón, I Kallfass 2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022 | 6 | 2022 |
| Characterization of electrical parameters for health monitoring in sic mosfets during ac power cycling KM Barón, K Sharma, M Nitzsche, I Kallfass 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021 | 5 | 2021 |
| Non-Destructive Failure Analysis of Power Devices via Time-Domain Reflectometry K Sharma, S Kamm, V Afanasenko, KM Barón, I Kallfass 2021 IEEE 17th International Conference on Automation Science and …, 2021 | 5 | 2021 |
| Characterisation of the junction temperature of gallium-nitride power devices via quasi-threshold voltage as temperature sensitive electrical parameter K Sharma, KM Barón, J Ruthardt, I Kallfass The 10th International Conference on Power Electronics, Machines and Drives …, 2020 | 5 | 2020 |
| Static and dynamic characterization of a monolithic integrated temperature sensor in a 600 v gan power ic D Koch, S Moench, R Reiner, J Hueckelheim, KM Baron, P Waltereit, ... PCIM Europe digital days 2020; International Exhibition and Conference for …, 2020 | 5 | 2020 |
| Analysis of a transistor-based on-state voltage measurement circuit for condition monitoring of power transistors KM Barón, MCJ Weiser, K Sharma, I Kallfass 2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 2556-2562, 2023 | 4 | 2023 |
| Virtual Junction Temperature Estimation during Dynamic Power Cycling Tests KM Barón, K Sharma, I Kallfass 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE …, 2023 | 3 | 2023 |
| Application-oriented characterization of thermally optimized, asymmetrical single chip packages for 100 v gan hemts D Koch, V Polezhaev, AB Sharma, KM Barón, T Huesgen, I Kallfass 2023 35th International Symposium on Power Semiconductor Devices and ICs …, 2023 | 2 | 2023 |
| A fast ON-State drain-to-source voltage amplifier for the dynamic characterization of GaN power transistors MCJ Weiser, KM Barón, T Fink, I Kallfass 2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 637-644, 2023 | 2 | 2023 |
| Letscope: Lifecycle extensions through software-defined predictive control of power electronics A Chu, CM Hermann, J Silz, J Pfau, KM Barón, N Anantharajaiah, ... IEEE EUROCON 2023-20th International Conference on Smart Technologies, 665-670, 2023 | 1 | 2023 |
| Online Health Monitoring in Power Modules for Inverter Topologies using Isolated Parameter Acquisition KM Barón, K Sharma, M Nitzsche, I Kallfass 2021 IEEE Design Methodologies Conference (DMC), 1-6, 2021 | 1 | 2021 |
| Realtime Junction Temperature Estimation in SiC Power Modules Based on Multiple TSEP Acquisition KM Baron, SS Dash, D Koch, K Sharma, I Kallfass PCIM Europe 2024; International Exhibition and Conference for Power …, 2024 | | 2024 |
| Sub-Five Second Wide-Bandgap Power Device Calorimetric Measurements Utilizing Optical Sensors and Peltier Elements R Schnitzler, T Fink, KM Baron, D Koch, P Rasic, I Kallfass PCIM Europe 2024; International Exhibition and Conference for Power …, 2024 | | 2024 |
