| Interface passivation for 31.25%-efficient perovskite/silicon tandem solar cells XY Chin, D Turkay, JA Steele, S Tabean, S Eswara, M Mensi, P Fiala, ... Science 381 (6653), 59-63, 2023 | 235 | 2023 |
| Alleviating nanostructural phase impurities enhances the optoelectronic properties, device performance and stability of cesium-formamidinium metal–halide perovskites M Othman, Q Jeangros, DA Jacobs, MH Futscher, S Zeiske, A Armin, ... Energy & Environmental Science 17 (11), 3832-3847, 2024 | 9 | 2024 |
| Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods CNS Kumar, S Tabean, A Morisset, P Wyss, M Lehmann, FJ Haug, ... Semiconductor Science and Technology 36 (8), 085003, 2021 | 6 | 2021 |
| Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects S Tabean, M Mousley, C Pauly, O De Castro, E Serralta, N Klingner, ... Ultramicroscopy 233, 113439, 2022 | 5 | 2022 |
| Scanning Transmission Ion Microscopy Time-of-Flight Spectroscopy Using 20 keV Helium Ions M Mousley, S Tabean, O Bouton, QH Hoang, T Wirtz, S Eswara Microscopy and Microanalysis 29 (2), 563-573, 2023 | 4 | 2023 |
| 5D-ToF-STIM Hyperspectral Imaging with a keV He+ Focused Ion Beam D Andersen, M Mousley, S Tabean, R Holeňák, E Ntemou, G Hobler, ... BIO Web of Conferences 129, 06006, 2024 | | 2024 |
| EXPLORING CORRELATIVE MICROSCOPY METHODOLOGIES FOR ENHANCED IMAGING AND ANALYSIS WITH HELIUM ION MICROSCOPE S Tabean LIST-Luxembourg Institute of Science and Technology [Material Research and …, 2023 | | 2023 |
| Analyses of Contrast in keV Scanning Transmission Helium Ion Microscopy S Tabean, M Mousley, G Hobler, O De Castro, T Wirtz, S Eswara # PLACEHOLDER_PARENT_METADATA_VALUE#, 2023 | | 2023 |
| Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions S Eswara, S Tabean, M Mousley, QH Hoang, O Bouton, O De Castro, ... Microscopy and Microanalysis 28 (S1), 34-35, 2022 | | 2022 |
| New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy S Tabean, S Eswara, M Mousley, O De Castro, JN Audinot, T Wirtz Microscopy and Microanalysis 27 (S1), 770-772, 2021 | | 2021 |
