| Rietveld refinement guidelines LB McCusker, RB Von Dreele, DE Cox, D Louër, P Scardi Journal of Applied Crystallography 32 (1), 36-50, 1999 | 2764 | 1999 |
| Simultaneous structure and size–strain refinement by the Rietveld method L Lutterotti, P Scardi Journal of applied Crystallography 23 (4), 246-252, 1990 | 854 | 1990 |
| Whole powder pattern modelling P Scardi, M Leoni Acta crystallographica section A 58 (2), 190-200, 2002 | 665 | 2002 |
| Line broadening analysis using integral breadth methods: a critical review P Scardi, M Leoni, R Delhez Journal of Applied Crystallography 37 (3), 381-390, 2004 | 459 | 2004 |
| Diffraction analysis of the microstructure of materials EJ Mittemeijer, P Scardi Springer Science & Business Media, 2013 | 446 | 2013 |
| Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting JI Langford, D Louër, P Scardi Journal of Applied Crystallography 33 (3), 964-974, 2000 | 417 | 2000 |
| LSI-a computer program for simultaneous refinement of material structure and microstructure L Lutterotti, P Scardi, P Maistrelli Journal of applied crystallography 25 (3), 459-462, 1992 | 303 | 1992 |
| PM2K: a flexible program implementing Whole Powder Pattern Modelling M Leoni, T Confente, P Scardi Z. Kristallogr. Suppl 23, 249-254, 2006 | 301 | 2006 |
| Absorption coefficient of bulk and thin film Cu2O C Malerba, F Biccari, CLA Ricardo, M D’Incau, P Scardi, A Mittiga Solar energy materials and solar cells 95 (10), 2848-2854, 2011 | 269 | 2011 |
| Diffraction line profiles from polydisperse crystalline systems P Scardi, M Leoni Acta Crystallographica Section A: Foundations of Crystallography 57 (5), 604-613, 2001 | 267 | 2001 |
| CZTS stoichiometry effects on the band gap energy C Malerba, F Biccari, CLA Ricardo, M Valentini, R Chierchia, M Müller, ... Journal of alloys and compounds 582, 528-534, 2014 | 212 | 2014 |
| Solar photoactivity of nano-N-TiO2 from tertiary amine: role of defects and paramagnetic species F Spadavecchia, G Cappelletti, S Ardizzone, CL Bianchi, S Cappelli, ... Applied Catalysis B: Environmental 96 (3-4), 314-322, 2010 | 194 | 2010 |
| Reverse bending fatigue of shot peened 7075-T651 aluminium alloy: The role of residual stress relaxation M Benedetti, V Fontanari, P Scardi, CLA Ricardo, M Bandini International Journal of Fatigue 31 (8-9), 1225-1236, 2009 | 192 | 2009 |
| Thermal diffusivity/microstructure relationship in Y-PSZ thermal barrier coatings F Cernuschi, P Bianchi, M Leoni, P Scardi Journal of Thermal Spray Technology 8, 102-109, 1999 | 181 | 1999 |
| Line profile analysis: pattern modelling versus profile fitting P Scardi, M Leoni Journal of applied crystallography 39 (1), 24-31, 2006 | 180 | 2006 |
| Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects P Scardi, M Leoni Journal of applied crystallography 32 (4), 671-682, 1999 | 157 | 1999 |
| Morphology, structure and chemistry of extracted diesel soot—Part I: Transmission electron microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy and synchrotron X … M Patel, CLA Ricardo, P Scardi, PB Aswath Tribology international 52, 29-39, 2012 | 130 | 2012 |
| Phase stability of scandia–yttria-stabilized zirconia TBCs M Leoni, RL Jones, P Scardi Surface and coatings technology 108, 107-113, 1998 | 130 | 1998 |
| MCX: a Synchrotron Radiation Beamline for X‐ray Diffraction Line Profile Analysis L Rebuffi, JR Plaisier, M Abdellatief, A Lausi, P Scardi Zeitschrift für anorganische und allgemeine Chemie 640 (15), 3100-3106, 2014 | 127 | 2014 |
| Dry and wet corrosion behaviour of AISI 304 stainless steel coated by sol-gel ZrO2 CeO2 films R Di Maggio, L Fedrizzi, S Rossi, P Scardi Thin Solid Films 286 (1-2), 127-135, 1996 | 122 | 1996 |
Cristy Leonor Azanza RicardoUniversidad Nacional Autónoma de México在 fata.unam.mx 的电子邮件经过验证
