| Influence of sample surface height for evaluation of peak extraction algorithms in confocal microscopy C Chen, J Wang, X Liu, W Lu, H Zhu, X Jiang Applied Optics 57 (22), 6516-6526, 2018 | 40 | 2018 |
| Corrected parabolic fitting for height extraction in confocal microscopy C Chen, J Wang, R Leach, W Lu, X Liu, X Jiang Optics Express 27 (3), 3682-3697, 2019 | 38 | 2019 |
| Deep learning based one-shot optically-sectioned structured illumination microscopy for surface measurement C Chai, C Chen, X Liu, ZL Lei Optics Express 29 (3), 4010-4021, 2021 | 33 | 2021 |
| Accurate and efficient height extraction in chromatic confocal microscopy using corrected fitting of the differential signal C Chen, W Yang, J Wang, W Lu, X Liu, X Jiang Precision Engineering 56, 447-454, 2019 | 30 | 2019 |
| Characterization of the displacement response in chromatic confocal microscopy with a hybrid radial basis function network W Lu, C Chen, J Wang, R Leach, C Zhang, X Liu, Z Lei, W Yang, X Jiang Optics Express 27 (16), 22737-22752, 2019 | 26 | 2019 |
| Classification of breast cancer histology images using MSMV-PFENet L Liu, W Feng, C Chen, M Liu, Y Qu, J Yang Scientific Reports 12 (1), 17447, 2022 | 20 | 2022 |
| Two-dimensional spectral signal model for chromatic confocal microscopy C Chen, R Leach, J Wang, X Liu, X Jiang, W Lu Optics Express 29 (5), 7179-7196, 2021 | 20 | 2021 |
| High-contrast light focusing through scattering media with multi-pixel encoding L Liu, K Ma, Y Qu, Q He, R Shao, C Chen, J Yang Applied Physics Express 14 (9), 092009, 2021 | 15 | 2021 |
| Fast and accurate mean-shift vector based wavelength extraction for chromatic confocal microscopy W Lu, C Chen, H Zhu, J Wang, R Leach, X Liu, J Wang, X Jiang Measurement Science and Technology 30 (11), 115104, 2019 | 15 | 2019 |
| Influence of optical aberrations on the peak extraction in confocal microscopy C Chen, J Wang, C Zhang, W Lu, X Liu, Z Lei, W Yang, XJ Jiang Optics Communications 449, 24-32, 2019 | 14 | 2019 |
| Rapid characterization of nano-scale structures in large-scale ultra-precision surfaces W Yang, X Liu, C Hu, W Lu, C Chen, Z Yao, Z Lei Optics and Lasers in Engineering 134, 106200, 2020 | 13 | 2020 |
| A rapid measurement method for structured surface in white light interferometry Z Lei, X Liu, LI Zhao, W Yang, C Chen, X Guo Journal of microscopy 276 (3), 118-127, 2019 | 10 | 2019 |
| Locally adaptive thresholding centroid localization in confocal microscopy C Chen, R Leach, J Wang, X Liu, X Jiang, W Lu Optics Letters 46 (7), 1616-1619, 2021 | 9 | 2021 |
| Asymmetry robust centroid localization in confocal microscopy C Chen, C Chai, X Liu, X Jiang, W Lu Optics Letters 47 (8), 1933-1936, 2022 | 6 | 2022 |
| Dual-Probe Atomic Force Microscopy based on tuning fork probes for critical dimension metrology Z Zheng, S Gao, W Li, X Liu, Y Shi, C Chen Ultramicroscopy 219, 113120, 2020 | 4 | 2020 |
| Parallel multi-slit modulation and decoding technique for high-resolution surface measurement in structured illumination microscopy C Chai, C Chen, J Huang, W You, S Wang, W Yang, X Liu, Z Lei Optics and Lasers in Engineering 168, 107670, 2023 | 3 | 2023 |
| Random-access multi-focus manipulation through superpixel-encoding wavefront engineering G Zou, R Shao, L Liu, Q He, C Ding, C Chen, J Yang, Y Qu Applied Physics Express 15 (11), 112004, 2022 | 3 | 2022 |
| Crosstalk decoupling measurement method to determine the six degrees of freedom of motion error of linear stages K Diao, C Chen, R Leach, X Liu, W Lu, W Yang Applied Optics 61 (6), 1284-1291, 2022 | 2 | 2022 |
| Sparse domain robust denoising method in optically-sectioned structured illumination microscopy for complex surface measurement C Chai, C Chen, T Qu, X Liu Optics and Lasers in Engineering 180, 108338, 2024 | 1 | 2024 |
| Honeycomb effect elimination in differential phase fiber-bundle-based endoscopy J Wang, C Chen, W You, Y Jiao, X Liu, X Jiang, W Lu Optics Express 32 (12), 20682-20694, 2024 | 1 | 2024 |
LU WENLONGhuazhong University of science and technology在 mail.hust.edu.cn 的电子邮件经过验证
