Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring PW Srivastava, N Mittal Applied Mathematical Modelling 34 (10), 3166-3178, 2010 | 59 | 2010 |
A log-logistic step-stress model PW Srivastava, R Shukla IEEE Transactions on Reliability 57 (3), 431-434, 2008 | 34 | 2008 |
Optimum multi-objective ramp-stress accelerated life test with stress upper bound for Burr type-XII distribution PW Srivastava, N Mittal IEEE Transactions on Reliability 61 (4), 1030-1038, 2012 | 25 | 2012 |
Optimum log‐logistic step‐stress model with censoring P Wanti Srivastava, R Shukla International Journal of Quality & Reliability Management 25 (9), 968-976, 2008 | 22 | 2008 |
Optimum constant-stress partially accelerated life tests for the truncated logistic distribution under time constraint PW Srivastava, N Mittal International Journal of Operational Research/Nepal 2, 33-47, 2013 | 14 | 2013 |
Optimum time-censored modified ramp-stress ALT for the Burr Type XII distribution with warranty: A goal programming approach PW Srivastava, T Gupta International Journal of Reliability, Quality and Safety Engineering 22 (03 …, 2015 | 11 | 2015 |
Failure-censored optimum constant-stress partially accelerated life tests for the truncated logistic life distribution PW Srivastava, N Mittal Int J Bus Manag 3 (2), 41-66, 2013 | 10 | 2013 |
Optimum simple ramp test for the log-logistic distribution with censoring PW Srivastava, R Shukla Proceedings of the Institution of Mechanical Engineers, Part O: Journal of …, 2009 | 10 | 2009 |
Optimum modified ramp-stress ALT plan with competing causes of failure PW Srivastava, T Gupta International Journal of Quality & Reliability Management 34 (5), 733-746, 2017 | 9 | 2017 |
Optimum ramp-stress accelerated life test for m identical repairable systems PW Srivastava, N Jain Applied mathematical modelling 35 (12), 5786-5793, 2011 | 9 | 2011 |
Optimum accelerated life testing models with time-varying stresses PW Srivastava World Scientific, 2017 | 8 | 2017 |
Optimum Time‐Censored Constant‐Stress PALTSP for the Burr Type XII Distribution Using Tampered Failure Rate Model PW Srivastava, D Sharma Journal of Quality and Reliability Engineering 2014 (1), 564049, 2014 | 8 | 2014 |
Copula based constant-stress PALT using tampered failure rate model with dependent competing risks PW Srivastava, T Gupta International Journal of Quality & Reliability Management 36 (4), 510-525, 2019 | 7 | 2019 |
Optimum time-censored simple ramp-stress accelerated life test sampling plan for the log-logistic distribution PW Srivastava, D Sharma Journal of Quality in Maintenance Engineering 21 (1), 112-132, 2015 | 7 | 2015 |
Optimum multi-objective modified constant-stress accelerated life test plan for the Burr type-XII distribution with type-I censoring PW Srivastava, N Mittal Proceedings of the Institution of Mechanical Engineers, Part O: Journal of …, 2013 | 7 | 2013 |
An accelerated life test plan for a two-component parallel system under ramp-stress loading using masked data PW Srivastava International Journal of Quality & Reliability Management 35 (3), 811-820, 2018 | 5 | 2018 |
Optimum failure-censored step-stress partially accelerated life test for the truncated logistic life distribution PW Srivastava, N Mittal International Journal of Reliability and Applications 13 (1), 19-35, 2012 | 5 | 2012 |
Reliability prediction during development phase of a system S Preeti Wanti, J Nidhi Quality Technology & Quantitative Management 8 (2), 111-124, 2011 | 5 | 2011 |
OPTIMUM MULTI-LEVEL RAMP-STRESS ALT PLAN WITH MULTIPLE-OBJECTIVES FOR BURR TYPE-XII DISTRIBUTION UNDER TYPE-I CENSORING PW Srivastava, N Mittal International Journal of Reliability, Quality and Safety Engineering 19 (02 …, 2012 | 4 | 2012 |
Tests for exponentiality against new better than old in expectation and new better than some used in expectation alternatives K Sen, PW Srivastava Communications in Statistics-Theory and Methods 29 (1), 157-180, 2000 | 4 | 2000 |