The science performance of JWST as characterized in commissioning J Rigby, M Perrin, M McElwain, R Kimble, S Friedman, M Lallo, R Doyon, ... Publications of the Astronomical Society of the Pacific 135 (1046), 048001, 2023 | 284 | 2023 |
The James Webb space telescope mission JP Gardner, JC Mather, R Abbott, JS Abell, M Abernathy, FE Abney, ... Publications of the Astronomical Society of the Pacific 135 (1048), 068001, 2023 | 234 | 2023 |
Optical wavefront measurement using phase retrieval with transverse translation diversity GR Brady, M Guizar-Sicairos, JR Fienup Optics express 17 (2), 624-639, 2009 | 138 | 2009 |
Nonlinear optimization algorithm for retrieving the full complex pupil function GR Brady, JR Fienup Optics express 14 (2), 474-486, 2006 | 135 | 2006 |
The James Webb Space Telescope mission: optical telescope element design, development, and performance MW McElwain, LD Feinberg, MD Perrin, M Clampin, CM Mountain, ... Publications of the Astronomical Society of the Pacific 135 (1047), 058001, 2023 | 71 | 2023 |
Integration of fluorescence collection optics witháaámicrofabricated surface electrode ion trap GR Brady, AR Ellis, DL Moehring, D Stick, C Highstrete, KM Fortier, ... Applied Physics B 103, 801-808, 2011 | 55 | 2011 |
Measurement range of phase retrieval in optical surface and wavefront metrology GR Brady, JR Fienup Applied optics 48 (3), 442-449, 2009 | 47 | 2009 |
Multiple angles of incidence semiconductor metrology systems and methods DY Wang, K Flock, L Rotter, S Krishnan, JD De Veer, C Filip, G Brady, ... US Patent 9,116,103, 2015 | 33 | 2015 |
High-contrast imager for complex aperture telescopes (HiCAT): 5. first results with segmented-aperture coronagraph and wavefront control R Soummer, GR Brady, K Brooks, T Comeau, É Choquet, T Dillon, ... Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter …, 2018 | 32 | 2018 |
Optical metrology tool equipped with modulated illumination sources AV Shchegrov, LD Rotter, DY Wang, A Veldman, K Peterlinz, G Brady, ... US Patent 9,400,246, 2016 | 29 | 2016 |
Apparatus and method of measuring roughness and other parameters of a structure AV Shchegrov, G Brady, K Peterlinz US Patent 8,982,358, 2015 | 24 | 2015 |
Phase retrieval as an optical metrology tool GR Brady, JR Fienup Optifab 2005: Technical Digest 10315, 143-145, 2005 | 24 | 2005 |
Phasing the Webb telescope DS Acton, S Knight, M Carrasquilla, N Weiser, M Masciarelli, S Jurczyk, ... Space Telescopes and Instrumentation 2022: Optical, Infrared, and Millimeter …, 2022 | 22 | 2022 |
Systems for providing illumination in optical metrology GR Brady, AV Shchegrov, LD Rotter, D Shaughnessy, A Shchemelinin, ... US Patent 9,512,985, 2016 | 22 | 2016 |
Metrology system optimization for parameter tracking A Veldman, AV Shchegrov, G Brady, TG Dziura, SI Pandev, A Kuznetsov US Patent 9,255,877, 2016 | 22 | 2016 |
Compressive sensing for metrology SI Pandev, A Kuznetsov, GR Brady, AV Shchegrov, N Sapiens, JJ Hench US Patent 9,518,916, 2016 | 21 | 2016 |
High-contrast imager for complex aperture telescopes (HiCAT): 6. software control infrastructure and calibration C Moriarty, K Brooks, R Soummer, M Perrin, T Comeau, G Brady, ... Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter …, 2018 | 18 | 2018 |
Improved optical metrology using phase retrieval GR Brady, JR Fienup Optical fabrication and testing, OTuB3, 2004 | 17 | 2004 |
Characterization of JWST science performance from commissioning J Rigby, M Perrin, M Mcelwain, R Kimble, S Friedman, M Lallo, R Doyon, ... | 16 | 2022 |
Multiple angles of incidence semiconductor metrology systems and methods DY Wang, K Flock, L Rotter, S Krishnan, JD De Veer, C Filip, G Brady, ... US Patent 9,310,290, 2016 | 15 | 2016 |