Critical Terrace Width for Two-Dimensional Nucleation during Si Growth <?format ?>on Si(111)-() Surface DI Rogilo, LI Fedina, SS Kosolobov, BS Ranguelov, AV Latyshev Physical Review Letters 111 (3), 036105, 2013 | 52 | 2013 |
On the role of mobile nanoclusters in 2D island nucleation on Si (111)-(7× 7) surface DI Rogilo, LI Fedina, SS Kosolobov, AV Latyshev Surface Science 667, 1-7, 2018 | 20 | 2018 |
2D Si island nucleation on the Si (111) surface at initial and late growth stages: On the role of step permeability in pyramidlike growth DI Rogilo, LI Fedina, SS Kosolobov, BS Ranguelov, AV Latyshev Journal of Crystal Growth 457, 188-195, 2017 | 20 | 2017 |
Etching of step-bunched Si (1 1 1) surface by Se molecular beam observed by in situ REM DI Rogilo, LI Fedina, SA Ponomarev, DV Sheglov, AV Latyshev Journal of Crystal Growth 529, 125273, 2020 | 18 | 2020 |
SiCxNyOz Coatings Enhance Endothelialization and Bactericidal activity and Reduce Blood Cell Activation N Bhaskar, V Sulyaeva, E Gatapova, V Kaichev, D Rogilo, M Khomyakov, ... ACS Biomaterials Science & Engineering 6 (10), 5571-5587, 2020 | 14 | 2020 |
Adatom concentration distribution on an extrawide Si (111) terrace during sublimation DI Rogilo, NE Rybin, LI Fedina, AV Latyshev Optoelectronics, Instrumentation and Data Processing 52, 501-507, 2016 | 13 | 2016 |
2D island nucleation controlled by nanocluster diffusion during Si and Ge epitaxy on Si (1 1 1)-(7× 7) surface at elevated temperatures AS Petrov, DI Rogilo, DV Sheglov, AV Latyshev Journal of Crystal Growth 531, 125347, 2020 | 12 | 2020 |
Step bunching phenomena on Si (0 0 1) surface induced by DC heating during sublimation and Si deposition EE Rodyakina, SV Sitnikov, DI Rogilo, AV Latyshev Journal of Crystal Growth 520, 85-88, 2019 | 12 | 2019 |
In situ reflection electron microscopy for the analysis of silicon surface processes: Sublimation, electromigration, and adsorption of impurity atoms DI Rogilo, SV Sitnikov, EE Rodyakina, AS Petrov, SA Ponomarev, ... Crystallography Reports 66, 570-580, 2021 | 10 | 2021 |
In situ reflection electron microscopy for investigation of surface processes on Bi2Se3 (0001) SA Ponomarev, DI Rogilo, NN Kurus, LS Basalaeva, KA Kokh, ... Journal of Physics: Conference Series 1984 (1), 012016, 2021 | 8 | 2021 |
Structural and morphological instabilities of the Si (1 1 1)-7× 7 surface during silicon growth and etching by oxygen and selenium D Rogilo, S Sitnikov, S Ponomarev, D Sheglov, L Fedina, A Latyshev Applied Surface Science 540, 148269, 2021 | 7 | 2021 |
Atomic structure of a single step and dynamics of Sn adatoms on the SiSn surface RA Zhachuk, DI Rogilo, AS Petrov, DV Sheglov, AV Latyshev, S Colonna, ... Physical Review B 104 (12), 125437, 2021 | 6 | 2021 |
Atomically Controlled Silicon Surface AV Latyshev, LI Fedina, DI Rogilo, SV Sitnikov, SS Kosolobov Novosibirsk, Parallel, 2016 | 6 | 2016 |
Formation of Two-Dimensional Islands on the Si (111) Surface during Epitaxial Growth DI Rogilo, LI Fedina, SS Kosolobov, AV Latyshev Vestn. NGU, Ser. Fizika 9 (2), 156-166, 2014 | 5 | 2014 |
Atomic processes on the silicon surface AV Latyshev, LI Fedina, SS Kosolobov, SV Sitnikov, DI Rogilo, ... Advances in Semiconductor Nanostructures, 189-221, 2017 | 4 | 2017 |
Bottom-up generated height gauges for silicon-based nanometrology DV Sheglov, DI Rogilo, LI Fedina, SV Sitnikov, EV Sysoev, AV Latyshev ACS Applied Materials & Interfaces 15 (9), 12511-12523, 2023 | 3 | 2023 |
Structural transitions on Si (1 1 1) surface during Sn adsorption, electromigration, and desorption studied by in situ UHV REM AS Petrov, DI Rogilo, RA Zhachuk, AI Vergules, DV Sheglov, AV Latyshev Applied Surface Science 609, 155367, 2023 | 3 | 2023 |
Chemical Structure and Functional Properties of Amorphous Boron Carbonitride Films VS Sulyaeva, EY Gatapova, AK Kozhevnikov, DI Rogilo, AA Saraev, ... Journal of Structural Chemistry 62, 1309-1324, 2021 | 3 | 2021 |
Thermal Hysteresis in the Resistance of In2Se3 Film on Si(111) Surface S Ponomarev, D Rogilo, A Mironov, D Sheglov, A Latyshev 2021 IEEE 22nd International Conference of Young Professionals in Electron …, 2021 | 3 | 2021 |
From self-organization of monoatomic steps on the silicon surface to subnanometer metrology DV Sheglov, SV Sitnikov, LI Fedina, DI Rogilo, AS Kozhukhov, ... Optoelectronics, Instrumentation and Data Processing 56, 533-544, 2020 | 3 | 2020 |