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Wu Lizhou
Wu Lizhou
在 m.fudan.edu.cn 的电子邮件经过验证
标题
引用次数
引用次数
年份
Endurance Prediction Based on Hidden Markov Model and Programming Optimization for 28nm 1Mbit Resistive Random Access Memory Chip
X Zheng, L Wu, D Dong, J Yu, J Lai, W Sun, X Xue, B Chen, W Pang, X Xu
IEEE Electron Device Letters 44 (6), 919-922, 2023
32023
GauSPU: 3D Gaussian Splatting Processor for Real-Time SLAM Systems
L Wu, H Zhu, S He, J Zheng, C Chen, X Zeng
2024 57th IEEE/ACM International Symposium on Microarchitecture (MICRO …, 2024
2024
Hi-NeRF: A Multicore NeRF Accelerator With Hierarchical Empty Space Skipping for Edge 3-D Rendering
L Wu, H Zhu, J Zheng, M Li, Y Cheng, Q Liu, X Zeng, C Chen
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2024
2024
CAMPER: Exploring the Potential of Content Addressable Memory for 3D Point Cloud Efficient Range Search
J Zheng, L Wu, Y Su, J Wang, Z Huang, C Chen, Q Liu
Proceedings of the 61st ACM/IEEE Design Automation Conference, 1-6, 2024
2024
Lifetime Improvement of 28 nm Resistive Random Access Memory Chip by Machine Learning‐Assisted Prediction Model Collaborated with Resurrection Algorithm
X Zheng, L Wu, Y Xie, J Lai, W Sun, J Yu, D Dong, Z Yu, X Xue, B Chen, ...
Advanced Electronic Materials 10 (5), 2300504, 2024
2024
A Heuristic and Greedy Weight Remapping Scheme with Hardware Optimization for Irregular Sparse Neural Networks Implemented on CIM Accelerator in Edge AI Applications
L Wu, C Zhao, J Wang, X Yu, S Chen, C Li, J Han, X Xue, X Zeng
2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), 551-556, 2024
2024
Point-of-Care Testing (POCT) System based on self-Recovery Memoristor Chip with Low Energy Consuption (1.547 TOPS/W) and High Recognition (1142 fram/s)
X Zheng, L Wu, Y Liu, Q Wu, Y Xie, Y Li, J Lai, W Sun, D Dong, J Yu, X Xu, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
2023
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