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Ali Ahmadi
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Bio-inspired imprecise computational blocks for efficient VLSI implementation of soft-computing applications
HR Mahdiani, A Ahmadi, SM Fakhraie, C Lucas
IEEE Transactions on Circuits and Systems I: Regular Papers 57 (4), 850-862, 2009
7202009
A rapid and simple ratiometric fluorescent sensor for patulin detection based on a stabilized DNA duplex probe containing less amount of aptamer-involved base pairs
A Ahmadi, NM Danesh, M Ramezani, M Alibolandi, P Lavaee, AS Emrani, ...
Talanta 204, 641-646, 2019
452019
Brain-computer interface signal processing algorithms: A computational cost vs. accuracy analysis for wearable computers
A Ahmadi, O Dehzangi, R Jafari
2012 Ninth International Conference on Wearable and Implantable Body Sensor …, 2012
282012
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs
A Ahmadi, A Nahar, B Orr, M Past, Y Makris
2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016
232016
A low-cost fault-tolerant approach for hardware implementation of artificial neural networks
A Ahmadi, MH Sargolzaie, SM Fakhraie, C Lucas, S Vakili
2009 International Conference on Computer Engineering and Technology 2, 93-97, 2009
212009
Workload characterization and prediction: A pathway to reliable multi-core systems
M Zaman, A Ahmadi, Y Makris
2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 116-121, 2015
192015
Light-weight single trial EEG signal processing algorithms: computational profiling for low power design
A Ahmadi, R Jafari, J Hart
2011 Annual international conference of the IEEE engineering in medicine and …, 2011
182011
Yield forecasting in Fab-to-Fab production migration based on Bayesian model fusion
A Ahmadi, HG Stratigopoulos, A Nahar, B Orr, M Pas, Y Makris
2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 9-14, 2015
162015
Yield forecasting across semiconductor fabrication plants and design generations
A Ahmadi, HG Stratigopoulos, K Huang, A Nahar, B Orr, M Pas, JM Carulli, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
152017
A machine learning approach to fab-of-origin attestation
A Ahmadi, MM Bidmeshki, A Nahar, B Orr, M Pas, Y Makris
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-6, 2016
112016
Wafer-level adaptive trim seed forecasting based on e-tests
C Xanthopoulos, A Ahmadi, S Boddikurapati, A Nahar, B Orr, Y Makris
2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017
102017
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation
A Ahmadi, K Huang, S Natarajan, JM Carulli, Y Makris
2014 International Test Conference, 1-10, 2014
102014
Harnessing process variations for optimizing wafer-level probe-test flow
A Ahmadi, C Xanthopoulos, A Nahar, B Orr, M Pas, Y Makris
2016 IEEE International Test Conference (ITC), 1-8, 2016
82016
Yield prognosis for Fab-to-Fab product migration
A Ahmadi, K Huang, A Nahar, B Orr, M Pas, JM Carulli, Y Makris
2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015
82015
Behavioral fault model for neural networks
A Ahmadi, SM Fakhraie, C Lucas
2009 International Conference on Computer Engineering and Technology 2, 71-75, 2009
62009
The effects of urban tourism on the quality of life of citizens (Case study: Yasouj of City)
ابوالفضل قنبری, الهام درخشان, سید موسی صالحی, سید موسی, ...
Journal of Tourism and Development 6 (1), 23-44, 2017
52017
− 197dBc/Hz FOM 4.3-GHz VCO Using an addressable array of minimum-sized nmos cross-coupled transistor pairs in 65-nm CMOS
A Jha, A Ahmadi, S Kshattry, T Cao, K Liao, G Yeap, Y Makris, O KK
2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits), 1-2, 2016
52016
Harnessing fabrication process signature for predicting yield across designs
A Ahmadi, HG Stratigopoulos, A Nahar, B Orr, M Pas, Y Makris
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 898-901, 2016
52016
Design flow for hardware implementation of digital filters
R Yousefi, A Ahmadi, SM Fakhraie
2008 International Symposium on Telecommunications, 586-591, 2008
52008
Gaussian process-based wafer-level correlation modeling and its applications
C Xanthopoulos, K Huang, A Ahmadi, N Kupp, J Carulli, A Nahar, B Orr, ...
Machine Learning in VLSI Computer-Aided Design, 119-173, 2019
32019
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