| Characterization of GaN HEMT low-frequency dispersion through a multiharmonic measurement system A Raffo, S Di Falco, V Vadala, G Vannini IEEE Transactions on Microwave Theory and Techniques 58 (9), 2490-2496, 2010 | 77 | 2010 |
| A load–pull characterization technique accounting for harmonic tuning V Vadalà, A Raffo, S Di Falco, G Bosi, A Nalli, G Vannini IEEE Transactions on Microwave Theory and Techniques 61 (7), 2695-2704, 2013 | 67 | 2013 |
| X-band GaN power amplifier for future generation SAR systems D Resca, A Raffo, S Di Falco, F Scappaviva, V Vadalà, G Vannini IEEE Microwave and Wireless Components Letters 24 (4), 266-268, 2014 | 56 | 2014 |
| Accurate GaN HEMT nonquasi‐static large‐signal model including dispersive effects G Crupi, A Raffo, DMMP Schreurs, G Avolio, V Vadalà, S Di Falco, ... Microwave and Optical Technology Letters 53 (3), 692-697, 2011 | 38 | 2011 |
| A new approach to class-E power amplifier design A Musio, V Vadalà, F Scappaviva, A Raffo, S Di Falco, G Vannini 2011 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits …, 2011 | 17 | 2011 |
| On the evaluation of the high-frequency load line in active devices A Raffo, G Avolio, DMMP Schreurs, S Di Falco, V Vadalà, F Scappaviva, ... International Journal of Microwave and Wireless Technologies 3 (1), 19-24, 2011 | 13 | 2011 |
| Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime A Raffo, S Di Falco, G Sozzi, R Menozzi, DMMP Schreurs, G Vannini Microelectronics Reliability 51 (2), 235-239, 2011 | 11 | 2011 |
| “Hybrid” approach to microwave power amplifier design A Raffo, V Vadala, S Di Falco, F Scappaviva, G Vannini 2010 Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits …, 2010 | 9 | 2010 |
| Power amplifier design accounting for input large-signal matching S Di Falco, A Raffo, V Vadalà, G Vannini 2012 7th European Microwave Integrated Circuit Conference, 465-468, 2012 | 7 | 2012 |
| A low-cost and accurate technique for the prediction of load-pull contours V Vadalà, A Raffo, S Di Falco, G Vannini 2010 IEEE MTT-S International Microwave Symposium, 1162-1165, 2010 | 6 | 2010 |
| Low-frequency waveform engineering technique for class-F microwave power amplifier design S Di Falco, A Raffo, G Vannini, V Vadalà 2011 6th European Microwave Integrated Circuit Conference, 288-291, 2011 | 5 | 2011 |
| GaN HEMT large-signal model accounting for both low-frequency dispersion and high-frequency non-quasi-static effects G Crupi, A Raffo, DMMP Schreurs, G Avolio, V Vadalà, S Di Falco, ... 2011 10th International Conference on Telecommunication in Modern Satellite …, 2011 | 5 | 2011 |
| GaN power amplifier design exploiting wideband large-signal matching S Di Falco, A Raffo, D Resca, F Scappaviva, V Vadalà, G Vannini 2012 Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits …, 2012 | 4 | 2012 |
| GaN HEMT nonlinear characterization for wideband high-power amplifier design V Vadalà, A Raffo, S Di Falco, G Vannini 2011 6th European Microwave Integrated Circuit Conference, 9-12, 2011 | 4 | 2011 |
| High-efficiency broadband power amplifier design technique based on a measured-load-line approach S Di Falco, A Raffo, F Scappaviva, D Resca, M Pagani, G Vannini 2010 IEEE MTT-S International Microwave Symposium, 1106-1109, 2010 | 2 | 2010 |
| Experimental investigation of LF dispersion and IMD asymmetry within GaN based HEMT technology G Avolio, A Raffo, D Schreurs, V Vadala, S Di Falco, A Lorenz, ... 2010 Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits …, 2010 | 2 | 2010 |
| Class-A power amplifier design technique based on electron device low-frequency characterization A Raffo, S Di Falco, V Vadala, F Scappaviva, G Vannini 2009 European Microwave Conference (EuMC), 1816-1819, 2009 | 2 | 2009 |
| DESIGN TECHNIQUES FOR HIGH-EFFICIENCY MICROWAVE POWER AMPLIFIERS S Di Falco Università degli studi di Ferrara, 2012 | | 2012 |
| Characterization of electron device breakdown under nonlinear dynamic operation A Raffo, S Di Falco, V Vadalà, G Vannini The 5th European Microwave Integrated Circuits Conference, 130-133, 2010 | | 2010 |
| Empirical Investigation on Device-Degradation Indicators Under Nonlinear Dynamic Regime A Raffo, S DI FALCO, G Sozzi, R Menozzi, D Schreurs, G Vannini ROCS Proceedings, 201-204, 2010 | | 2010 |
