Physics of resonant tunneling. The one-dimensional double-barrier case B Ricco, MY Azbel Physical Review B 29 (4), 1970, 1984 | 930 | 1984 |
Transport properties of polycrystalline silicon films G Baccarani, B Ricco, G Spadini Journal of applied physics 49 (11), 5565-5570, 1978 | 921 | 1978 |
Electrical impedance spectroscopy (EIS) for biological analysis and food characterization: A review M Grossi, B Riccò Journal of sensors and sensor systems 6 (2), 303-325, 2017 | 386 | 2017 |
High-field-induced degradation in ultra-thin SiO/sub 2/films P Olivo, TN Nguyen, B Ricco IEEE Transactions on Electron Devices 35 (12), 2259-2267, 1988 | 381 | 1988 |
CMOS DNA sensor array with integrated A/D conversion based on label-free capacitance measurement C Stagni, C Guiducci, L Benini, B Riccò, S Carrara, B Samorí, C Paulus, ... IEEE Journal of Solid-State Circuits 41 (12), 2956-2964, 2006 | 242 | 2006 |
Resonant tunneling of holes in AlAs‐GaAs‐AlAs heterostructures EE Mendez, WI Wang, B Ricco, L Esaki Applied physics letters 47 (4), 415-417, 1985 | 238 | 1985 |
Modeling and simulation of stress-induced leakage current in ultrathin SiO/sub 2/films B Ricco, G Gozzi, M Lanzoni IEEE Transactions on Electron Devices 45 (7), 1554-1560, 1998 | 228 | 1998 |
Nonvolatile multilevel memories for digital applications B Ricco, G Torelli, M Lanzoni, A Manstretta, HE Maes, D Montanari, ... Proceedings of the IEEE 86 (12), 2399-2423, 1998 | 206 | 1998 |
Estimate of signal probability in combinational logic networks S Ercolani, M Favalli, M Damiani, P Olivo, B Ricco Proceedings of the 1st European test conference, 132,133,134,135,136,137,138 …, 1989 | 206 | 1989 |
Scaling the MOS transistor below 0.1/spl mu/m: methodology, device structures, and technology requirements C Fiegna, H Iwai, T Wada, M Saito, E Sangiorgi, B Ricco IEEE Transactions on Electron Devices 41 (6), 941-951, 1994 | 168 | 1994 |
Low power control techniques for TFT LCD displays F Gatti, A Acquaviva, L Benini, B Ricco' Proceedings of the 2002 international conference on Compilers, architecture …, 2002 | 158 | 2002 |
Novel Mechanism for Tunneling and Breakdown of Thin Si O 2 Films B Ricco, MY Azbel, MH Brodsky Physical review letters 51 (19), 1795, 1983 | 151 | 1983 |
A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs F Venturi, RK Smith, EC Sangiorgi, MR Pinto, B Ricco IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1989 | 147 | 1989 |
DNA detection by integrable electronics C Guiducci, C Stagni, G Zuccheri, A Bogliolo, L Benini, B Samorı, B Ricco Biosensors and Bioelectronics 19 (8), 781-787, 2004 | 144 | 2004 |
A comprehensive analytical and numerical model of polysilicon emitter contacts in bipolar transistors Z Yu, B Ricco, RW Dutton IEEE Transactions on Electron Devices 31 (6), 773-784, 1984 | 139 | 1984 |
Quantum-mechanical modeling of accumulation layers in MOS structure J Sune, P Olivo, B Ricco IEEE Transactions on Electron Devices 39 (7), 1732-1739, 1992 | 137 | 1992 |
Monitoring system activity for OS-directed dynamic power management L Benini, A Bogliolo, S Cavallucci, B Riccó Proceedings of the 1998 international symposium on Low power electronics and …, 1998 | 129 | 1998 |
A many-band silicon model for hot-electron transport at high energies R Brunetti, C Jacoboni, F Venturi, E Sangiorgi, B Ricco Solid-state electronics 32 (12), 1663-1667, 1989 | 128 | 1989 |
A fully electronic label-free DNA sensor chip C Stagni, C Guiducci, L Benini, B Riccò, S Carrara, C Paulus, M Schienle, ... IEEE Sensors Journal 7 (4), 577-585, 2007 | 115 | 2007 |
Low‐frequency noise in silicon‐gate metal‐oxide‐silicon capacitors before oxide breakdown B Neri, P Olivo, B Ricco Applied physics letters 51 (25), 2167-2169, 1987 | 115 | 1987 |