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Omar El Gawhary
Omar El Gawhary
在 tudelft.nl 的电子邮件经过验证
标题
引用次数
引用次数
年份
Lorentz beams and symmetry properties in paraxial optics
O El Gawhary, S Severini
Journal of Optics A: Pure and Applied Optics 8 (5), 409, 2006
1582006
Lorentz beams as a basis for a new class of rectangularly symmetric optical fields
O El Gawhary, S Severini
Optics communications 269 (2), 274-284, 2007
702007
Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry
N Kumar, P Petrik, GKP Ramanandan, O El Gawhary, S Roy, SF Pereira, ...
Optics express 22 (20), 24678-24688, 2014
532014
Performance analysis of coherent optical scatterometry
O El Gawhary, N Kumar, SF Pereira, WMJ Coene, HP Urbach
Applied Physics B 105, 775-781, 2011
492011
Relativistic Hermite polynomials and Lorentz beams
A Torre, WAB Evans, O El Gawhary, S Severini
Journal of Optics A: Pure and Applied Optics 10 (11), 115007, 2008
452008
Degree of paraxiality for monochromatic light beams
O El Gawhary, S Severini
Optics letters 33 (12), 1360-1362, 2008
452008
Method and apparatus for determining structure parameters of microstructures
O El Gawhary, S Petra
European Patent Office, 2012
362012
Localization and paraxiality of pseudo-nondiffracting fields
O El Gawhary, S Severini
Optics communications 283 (12), 2481-2487, 2010
222010
Coherent Fourier scatterometry: tool for improved sensitivity in semiconductor metrology
N Kumar, O El Gawhary, S Roy, VG Kutchoukov, SF Pereira, W Coene, ...
Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012
212012
Extension of the classical Fabry–Perot formula to 1D multilayered structures
OE Gawhary, MC Dheur, SF Pereira, JJM Braat
Applied Physics B 111, 637-645, 2013
202013
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning
N Kumar, O El Gawhary, S Roy, SF Pereira, HP Urbach
Journal of the European Optical Society-Rapid Publications 8, 13048, 2013
182013
Nonlinearity characterization of array spectroradiometers for the solar UV measurements
T Pulli, S Nevas, O El Gawhary, S Van Den Berg, J Askola, P Kärhä, ...
Applied Optics 56 (11), 3077-3086, 2017
172017
Exploiting evanescent-wave amplification for subwavelength low-contrast particle detection
S Roy, SF Pereira, HP Urbach, X Wei, O El Gawhary
Physical Review A 96 (1), 013814, 2017
162017
Scanning effects in coherent fourier scatterometry
S Roy, O El Gawhary, N Kumar, SF Pereira, HP Urbach
Journal of the European Optical Society-Rapid Publications 7, 2012
152012
Electromagnetic scattering beyond the weak regime: Solving the problem of divergent Born perturbation series by Padé approximants
TA van der Sijs, O El Gawhary, HP Urbach
Physical Review Research 2, 013308, 2020
132020
Dependence of the degree of paraxiality on field correlations
O El Gawhary, S Severini
Optics letters 33 (16), 1866-1868, 2008
122008
Role of Radial Charges on the Angular Momentum of Electromagnetic Fields: Spin- 3 / 2 Light
O El Gawhary, T Van Mechelen, HP Urbach
Phys. Rev. Lett 21, 123202, 2018
112018
Restoration of s-polarized evanescent waves and subwavelength imaging by a single dielectric slab
O El Gawhary, NJ Schilder, A da Costa Assafrao, SF Pereira, HP Urbach
New Journal of Physics 14 (5), 053025, 2012
92012
Soft x-ray: novel metrology for 3D profilometry and device pitch overlay
C Porter, T Coenen, N Geypen, S Scholz, L van Rijswijk, HK Nienhuys, ...
Metrology, Inspection, and Process Control XXXVII 12496, 412-420, 2023
72023
On a propagation-invariant, orthogonal modal expansion on the unit disk: going beyond Nijboer–Zernike theory of aberrations
O El Gawhary
Optics Letters 40 (11), 2626-2629, 2015
62015
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