Lorentz beams and symmetry properties in paraxial optics O El Gawhary, S Severini Journal of Optics A: Pure and Applied Optics 8 (5), 409, 2006 | 158 | 2006 |
Lorentz beams as a basis for a new class of rectangularly symmetric optical fields O El Gawhary, S Severini Optics communications 269 (2), 274-284, 2007 | 70 | 2007 |
Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry N Kumar, P Petrik, GKP Ramanandan, O El Gawhary, S Roy, SF Pereira, ... Optics express 22 (20), 24678-24688, 2014 | 53 | 2014 |
Performance analysis of coherent optical scatterometry O El Gawhary, N Kumar, SF Pereira, WMJ Coene, HP Urbach Applied Physics B 105, 775-781, 2011 | 49 | 2011 |
Relativistic Hermite polynomials and Lorentz beams A Torre, WAB Evans, O El Gawhary, S Severini Journal of Optics A: Pure and Applied Optics 10 (11), 115007, 2008 | 45 | 2008 |
Degree of paraxiality for monochromatic light beams O El Gawhary, S Severini Optics letters 33 (12), 1360-1362, 2008 | 45 | 2008 |
Method and apparatus for determining structure parameters of microstructures O El Gawhary, S Petra European Patent Office, 2012 | 36 | 2012 |
Localization and paraxiality of pseudo-nondiffracting fields O El Gawhary, S Severini Optics communications 283 (12), 2481-2487, 2010 | 22 | 2010 |
Coherent Fourier scatterometry: tool for improved sensitivity in semiconductor metrology N Kumar, O El Gawhary, S Roy, VG Kutchoukov, SF Pereira, W Coene, ... Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012 | 21 | 2012 |
Extension of the classical Fabry–Perot formula to 1D multilayered structures OE Gawhary, MC Dheur, SF Pereira, JJM Braat Applied Physics B 111, 637-645, 2013 | 20 | 2013 |
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning N Kumar, O El Gawhary, S Roy, SF Pereira, HP Urbach Journal of the European Optical Society-Rapid Publications 8, 13048, 2013 | 18 | 2013 |
Nonlinearity characterization of array spectroradiometers for the solar UV measurements T Pulli, S Nevas, O El Gawhary, S Van Den Berg, J Askola, P Kärhä, ... Applied Optics 56 (11), 3077-3086, 2017 | 17 | 2017 |
Exploiting evanescent-wave amplification for subwavelength low-contrast particle detection S Roy, SF Pereira, HP Urbach, X Wei, O El Gawhary Physical Review A 96 (1), 013814, 2017 | 16 | 2017 |
Scanning effects in coherent fourier scatterometry S Roy, O El Gawhary, N Kumar, SF Pereira, HP Urbach Journal of the European Optical Society-Rapid Publications 7, 2012 | 15 | 2012 |
Electromagnetic scattering beyond the weak regime: Solving the problem of divergent Born perturbation series by Padé approximants TA van der Sijs, O El Gawhary, HP Urbach Physical Review Research 2, 013308, 2020 | 13 | 2020 |
Dependence of the degree of paraxiality on field correlations O El Gawhary, S Severini Optics letters 33 (16), 1866-1868, 2008 | 12 | 2008 |
Role of Radial Charges on the Angular Momentum of Electromagnetic Fields: Spin- 3 / 2 Light O El Gawhary, T Van Mechelen, HP Urbach Phys. Rev. Lett 21, 123202, 2018 | 11 | 2018 |
Restoration of s-polarized evanescent waves and subwavelength imaging by a single dielectric slab O El Gawhary, NJ Schilder, A da Costa Assafrao, SF Pereira, HP Urbach New Journal of Physics 14 (5), 053025, 2012 | 9 | 2012 |
Soft x-ray: novel metrology for 3D profilometry and device pitch overlay C Porter, T Coenen, N Geypen, S Scholz, L van Rijswijk, HK Nienhuys, ... Metrology, Inspection, and Process Control XXXVII 12496, 412-420, 2023 | 7 | 2023 |
On a propagation-invariant, orthogonal modal expansion on the unit disk: going beyond Nijboer–Zernike theory of aberrations O El Gawhary Optics Letters 40 (11), 2626-2629, 2015 | 6 | 2015 |