| A case study of IR-drop in structured at-speed testing J Saxena, KM Butler, VB Jayaram, S Kundu, NV Arvind, P Sreeprakash, ... International Test Conference, 2003. Proceedings. ITC 2003., 1098-1098, 2003 | 525 | 2003 |
| Minimizing power consumption in scan testing: Pattern generation and DFT techniques KM Butler, J Saxena, A Jain, T Fryars, J Lewis, G Hetherington 2004 International Conferce on Test, 355-364, 2004 | 362 | 2004 |
| An analysis of power reduction techniques in scan testing J Saxena, KM Butler, L Whetsel Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 670-677, 2001 | 204 | 2001 |
| A case study on the implementation of the Illinois scan architecture FF Hsu, KM Butler, JH Patel Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 538-547, 2001 | 177 | 2001 |
| Scan-based transition fault testing-implementation and low cost test challenges J Saxena, KM Butler, J Gatt, R Raghuraman, SP Kumar, S Basu, ... Proceedings. International Test Conference, 1120-1129, 2002 | 168 | 2002 |
| REDO-random excitation and deterministic observation-first commercial experiment MR Grimaila, S Lee, J Dworak, KM Butler, B Stewart, H Balachandran, ... Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 268-274, 1999 | 145 | 1999 |
| Heuristics to compute variable orderings for efficient manipulation of ordered binary decision diagrams KM Butler, DE Ross, R Kapur, MR Mercer Proceedings of the 28th ACM/IEEE Design Automation Conference, 417-420, 1991 | 135 | 1991 |
| Power supply noise: A survey on effects and research M Tehranipoor, KM Butler IEEE Design & Test of Computers 27 (2), 51-67, 2010 | 101 | 2010 |
| Defect-oriented testing and defective-part-level prediction J Dworak, JD Wicker, S Lee, MR Grimaila, MR Mercer, KM Butler, ... IEEE Design & Test of Computers 18 (1), 31-41, 2001 | 73 | 2001 |
| System and method for structurally testing integrated circuit devices KM Butler, TJ Powell US Patent 5,694,402, 1997 | 73 | 1997 |
| Quantifying non-target defect detection by target fault test sets KM Butler, MR Mercer Proc. European Test Conference, 91-100, 1991 | 72 | 1991 |
| Fast functional evaluation of candidate OBDD variable orderings DE Ross, KM Butler, R Kapur, MR Mercer Proceedings of the European Conference on Design Automation., 4-10, 1991 | 56 | 1991 |
| Quality improvement and cost reduction using statistical outlier methods A Nahar, KM Butler, JM Carulli, C Weinberger 2009 IEEE International Conference on Computer Design, 64-69, 2009 | 49 | 2009 |
| Test cost reduction through performance prediction using virtual probe HM Chang, KT Cheng, W Zhang, X Li, KM Butler 2011 IEEE International Test Conference, 1-9, 2011 | 47 | 2011 |
| Local at-speed scan enable generation for transition fault testing using low-cost testers N Ahmed, M Tehranipoor, CP Ravikumar, KM Butler IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007 | 46 | 2007 |
| Test data analytics—Exploring spatial and test-item correlations in production test data CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli, KM Butler 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 44 | 2013 |
| Correlation of logical failures to a suspect process step H Balachandran, J Parker, D Shupp, S Butler, KM Butler, C Force, J Smith International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 40 | 1999 |
| CATAPULT: Concurrent automatic testing allowing parallelization and using limited topology RK Gaede, MR Mercer, K Butler, DE Ross 25th ACM/IEEE, Design Automation Conference. Proceedings 1988., 597-600, 1988 | 40 | 1988 |
| Bridging fault diagnosis in the absence of physical information DB Lavo, B Chess, T Larrabee, FJ Ferguson, J Saxena, KM Butler Proceedings International Test Conference 1997, 887-893, 1997 | 38 | 1997 |
| Assessing fault model and test quality KM Butler, MR Mercer Springer Science & Business Media, 2012 | 36 | 2012 |
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