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Miklós Serényi
Miklós Serényi
EK MFA
在 mfa.kfki.hu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Modification of Al/Si interface and Schottky barrier height with chemical treatment
ZJ Horváth, M Ádám, I Szabó, M Serényi, V Van Tuyen
Applied surface science 190 (1-4), 441-444, 2002
722002
Refractive index of sputtered silicon oxynitride layers for antireflection coating
M Serényi, M Rácz, T Lohner
Vacuum 61 (2-4), 245-249, 2001
592001
Bandwidth-limited picosecond pulse generation in an actively mode-locked GaAs laser with intracavity chirp compensation
J Kuhl, M Serényi, EO Göbel
Optics letters 12 (5), 334-336, 1987
541987
Intracavity photoacoustic gas detection with an external cavity diode laser
Z Bozóki, J Sneider, G Szabó, A Miklós, M Serényi, G Nagy, M Fehér
Applied Physics B 63, 399-401, 1996
411996
Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction
M Serényi, T Lohner, P Petrik, Z Zolnai, ZE Horváth, NQ Khánh
Thin Solid Films 516 (22), 8096-8100, 2008
402008
Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy
M Serényi, T Lohner, P Petrik, C Frigeri
Thin Solid Films 515 (7-8), 3559-3562, 2007
342007
Directly controlled deposition of antireflection coatings for semiconductor lasers
M Serenyi, HU Habermeier
Applied optics 26 (5), 845-849, 1987
341987
Pulse shortening of actively mode‐locked diode lasers by wavelength tuning
M Serenyi, J Kuhl, EO Göbel
Applied physics letters 50 (18), 1213-1215, 1987
281987
Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films
M Serényi, T Lohner, G Sáfrán, J Szívós
Vacuum 128, 213-218, 2016
192016
Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces
S Gurbán, P Petrik, M Serényi, A Sulyok, M Menyhárd, E Baradács, ...
Scientific Reports 8 (1), 2124, 2018
172018
Structural modifications induced in hydrogenated amorphous Si/Ge multilayers by heat treatments
C Frigeri, M Serényi, A Csik, Z Erdélyi, DL Beke, L Nasi
Journal of Materials Science: Materials in Electronics 19, 289-293, 2008
172008
Micro-combinatorial sampling of the optical properties of hydrogenated amorphous for the entire range of compositions towards a database for …
B Kalas, Z Zolnai, G Sáfrán, M Serényi, E Agocs, T Lohner, A Nemeth, ...
Scientific reports 10 (1), 19266, 2020
162020
AFM and TEM study of hydrogenated sputtered Si/Ge multilayers
C Frigeri, L Nasi, M Serényi, A Csik, Z Erdélyi, DL Beke
Superlattices and Microstructures 45 (4-5), 475-481, 2009
152009
Acceleration of cold Rb atoms by frequency modulated light pulses
JS Bakos, GP Djotyan, PN Ignácz, MA Kedves, M Serényi, Z Sörlei, ...
The European Physical Journal D 44, 141-149, 2007
142007
Effect of heat treatments on the properties of hydrogenated amorphous silicon for PV and PVT applications
C Frigeri, M Serényi, Z Szekrényes, K Kamarás, A Csik, NQ Khánh
Solar Energy 119, 225-232, 2015
132015
Interaction of frequency modulated light pulses with rubidium atoms in a magneto-optical trap
JS Bakos, GP Djotyan, PN Ignácz, MÁ Kedves, M Serényi, Z Sörlei, ...
The European Physical Journal D-Atomic, Molecular, Optical and Plasma …, 2006
132006
Characterization of sputtered aluminum oxide films using spectroscopic ellipsometry
T Lohner, M Serényi, P Petrik
International Journal of New Horizons in Physics 2 (1), 1-4, 2015
122015
On the formation of blisters in annealed hydrogenated a-Si layers
M Serényi, C Frigeri, Z Szekrényes, K Kamarás, L Nasi, A Csik, NQ Khánh
Nanoscale research letters 8, 1-7, 2013
112013
Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory
T Lohner, B Kalas, P Petrik, Z Zolnai, M Serényi, G Sáfrán
Applied Sciences 8 (5), 826, 2018
102018
Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers
C Frigeri, M Serényi, NQ Khánh, A Csik, F Riesz, Z Erdélyi, L Nasi, ...
Nanoscale research letters 6, 1-6, 2011
102011
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