| Tuning the conductance of single-walled carbon nanotubes by ion irradiation in the Anderson localization regime C Gómez-Navarro, PJD Pablo, J Gómez-Herrero, B Biel, FJ Garcia-Vidal, ... Nature materials 4 (7), 534-539, 2005 | 456 | 2005 |
| Charge transport in disordered graphene-based low dimensional materials A Cresti, N Nemec, B Biel, G Niebler, F Triozon, G Cuniberti, S Roche Nano Research 1, 361-394, 2008 | 387 | 2008 |
| Anomalous doping effects on charge transport in graphene nanoribbons B Biel, X Blase, F Triozon, S Roche Physical review letters 102 (9), 096803, 2009 | 380 | 2009 |
| Transport Length Scales in Disordered Graphene-Based Materials:<? format?> Strong Localization Regimes and Dimensionality Effects A Lherbier, B Biel, YM Niquet, S Roche Physical review letters 100 (3), 036803, 2008 | 224 | 2008 |
| Chemically induced mobility gaps in graphene nanoribbons: a route for upscaling device performances B Biel, F Triozon, X Blase, S Roche Nano letters 9 (7), 2725-2729, 2009 | 107 | 2009 |
| Versatile synthesis and enlargement of functionalized distorted heptagon-containing nanographenes IR Márquez, N Fuentes, CM Cruz, V Puente-Muñoz, L Sotorrios, ... Chemical Science 8 (2), 1068-1074, 2017 | 104 | 2017 |
| Schottky contacts on passivated GaAs (1 0 0) surfaces: barrier height and reactivity T Kampen, A Schüller, DRT Zahn, B Biel, J Ortega, R Pérez, F Flores Applied surface science 234 (1-4), 341-348, 2004 | 100 | 2004 |
| Quantum transport in graphene nanoribbons: Effects of edge reconstruction and chemical reactivity SMM Dubois, A Lopez-Bezanilla, A Cresti, F Triozon, B Biel, JC Charlier, ... ACS nano 4 (4), 1971-1976, 2010 | 95 | 2010 |
| Anderson localization in carbon nanotubes: defect density and temperature effects B Biel, FJ Garcia-Vidal, A Rubio, F Flores Physical review letters 95 (26), 266801, 2005 | 92 | 2005 |
| Theoretical characterisation of point defects on a MoS2 monolayer by scanning tunnelling microscopy C González, B Biel, YJ Dappe Nanotechnology 27 (10), 105702, 2016 | 85 | 2016 |
| Adsorption of small inorganic molecules on a defective MoS 2 monolayer C Gonzalez, B Biel, YJ Dappe Physical Chemistry Chemical Physics 19 (14), 9485-9499, 2017 | 83 | 2017 |
| Atomistic boron-doped graphene field-effect transistors: a route toward unipolar characteristics P Marconcini, A Cresti, F Triozon, G Fiori, B Biel, YM Niquet, M Macucci, ... ACS nano 6 (9), 7942-7947, 2012 | 83 | 2012 |
| Operation and design of van der Waals tunnel transistors: A 3-D quantum transport study J Cao, D Logoteta, S Özkaya, B Biel, A Cresti, MG Pala, D Esseni IEEE Transactions on Electron Devices 63 (11), 4388-4394, 2016 | 43 | 2016 |
| Ab initio study of transport properties in defected carbon nanotubes: an O (N) approach B Biel, FJ Garcia-Vidal, A Rubio, F Flores Journal of Physics: Condensed Matter 20 (29), 294214, 2008 | 39 | 2008 |
| A potassium metal-organic framework based on perylene-3, 4, 9, 10-tetracarboxylate as sensing layer for humidity actuators JM Seco, E San Sebastián, J Cepeda, B Biel, A Salinas-Castillo, ... Scientific Reports 8 (1), 14414, 2018 | 38 | 2018 |
| Anderson localization regime in carbon nanotubes: size dependent properties F Flores, B Biel, A Rubio, FJ Garcia-Vidal, C Gomez-Navarro, P de Pablo, ... Journal of Physics: Condensed Matter 20 (30), 304211, 2008 | 34 | 2008 |
| Atomic-scale defects and electronic properties of a transferred synthesized MoS2 monolayer ID Marion, D Čapeta, B Pielić, F Faraguna, A Gallardo, P Pou, B Biel, ... Nanotechnology 29 (30), 305703, 2018 | 33 | 2018 |
| Surface roughness scattering model for arbitrarily oriented silicon nanowires IM Tienda-Luna, FG Ruiz, A Godoy, B Biel, F Gámiz Journal of Applied Physics 110 (8), 2011 | 28 | 2011 |
| Multi-Subband Ensemble Monte Carlo simulation of bulk MOSFETs for the 32 nm-node and beyond C Sampedro, F Gámiz, A Godoy, R Valín, A García-Loureiro, N Rodríguez, ... Solid-State Electronics 65, 88-93, 2011 | 24 | 2011 |
| Reactivity Enhancement and Fingerprints of Point Defects on a MoS2 Monolayer Assessed by ab Initio Atomic Force Microscopy C González, YJ Dappe, B Biel The Journal of Physical Chemistry C 120 (30), 17115-17126, 2016 | 22 | 2016 |
Alessandro CrestiUniv. Grenoble Alpes, CNRS, Grenoble INP, CROMA, F-38000 Grenoble, France在 grenoble-inp.fr 的电子邮件经过验证
