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Makhkam Khalilloev (ORCID: 0000-0001-5497-6410)
Makhkam Khalilloev (ORCID: 0000-0001-5497-6410)
其他姓名(ORCID: 0000-0001-5497-6410)
Urgench State University
在 urdu.uz 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Simulation of DIBL effect in 25 nm SOI-FinFET with the different body shapes
AE Atamuratov, A Abdikarimov, M Khalilloev, ZA Atamuratova, ...
Наносистемы: физика, химия, математика 8 (1), 2017
102017
The lateral capacitance of nanometer mnosfet with a single charge trapped in oxide layeror at SiO2-Si3N4 interfaceat
E Atamuratov, UA Aminov, ZA Atamuratova, M Halillaev, A Abdikarimov, ...
Наносистемы: физика, химия, математика 6 (6), 837-842, 2015
52015
Impact of the channel shape, back oxide and gate oxide layers on self-heating in nanoscale JL FINFET
AE Atamuratov, BO Jabbarova, MM Khalilloev, A Yusupov, ...
Наносистемы: физика, химия, математика 13 (2), 148-155, 2022
42022
Optimization of vertically stacked nanosheet FET immune to self-heating
M Balasubbareddy, K Sivasankaran, AE Atamuratov, MM Khalilloev
Micro and Nanostructures 182, 207633, 2023
32023
Self-heating effect in nanoscale SOI Junctionless FinFET with different geometries
AE Atamuratov, BO Jabbarova, MM Khalilloev, A Yusupov, AG Loureriro
2021 13th Spanish Conference on Electron Devices (CDE), 62-65, 2021
32021
The self-heating effect in junctionless fin field-effect transistors based on silicon-on-insulator structures with different channel shapes
AE Atamuratov, BO Jabbarova, MM Khalilloev, A Yusupov
Technical Physics Letters 47 (7), 542-545, 2021
22021
The Influence of Fin Shape on the Amplitude of Random Telegraph Noise in the Subthreshold Regime of a Junctionless FinFET
M.M.Khalilloeva, B.O.Jabbarova, A.A.Nasirov
Technical Physics Letters 45 (1063-7850), pp. 1245–1248., 2019
22019
The Influence of Fin Shape on the Amplitude of Random Telegraph Noise in the Subthreshold Regime of a Junctionless FinFET
AAN M. M. Khalilloeva*, B. O. Jabbarova
Technical Physics Letters 45 (1063-7850), pp. 1245–1248., 2019
22019
Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET
AE Atamuratov, MM Khalilloev, A Yusupov, AJ García-Loureiro, ...
Applied Sciences 10 (15), 5327, 2020
12020
Simulation of DIBL effect in junctionless SOI MOSFETs with extended gate
AE Atamuratov, M Khalilloev, A Abdikarimov, ZA Atamuratova, M Kittler, ...
Наносистемы: физика, химия, математика 8 (1), 2017
12017
Simulation study of short channel effects in junctionless SOI MOSFETS
M Khalilloev
arXiv preprint arXiv:2402.14900, 2024
2024
Comparative study of the self-heating effect in the accumulation and inversion mode FinFETs
AE Atamuratov, BO Jabbarova, ES Xaitbayev, DR Rajapov, MM Khalilloev
arXiv preprint arXiv:2402.10858, 2024
2024
Amplitude of Random Telegraph Noise in Junctionless FinFET with Different Channel Shape
AE Atamuratov, MM Khalilloev, A Yusupov, JC Chedjou, K Kyamakya
e-Journal of Surface Science and Nanotechnology 19, 9-12, 2021
2021
Влияние формы канала на амплитуду случайных телеграфных шумов в подпороговой области беспереходного FinFET-транзистора
М.M.Халиллоев, Б.О.Жаббарова, А.А.Насиров
Письма в ЖТФ 45, вып. 24, 2019
2019
Simulation of DIBL effect and sub-threshold swing in low power junctionless MOSFETs with different geometries
M Khalilloev, A Atamuratov, A Yusupov
Applied Science, Biofuels & Petroleum Engineering 5, 1, 2018
2018
USING COMSOL MULTIPHYSICS TO STUDY THE EFFECT OF MOSFET GATE DIELECTRIC THICKNESS AND EXTERNAL TEMPERATURE ON ITS OUTPUT CHARACTERISTICS
D Rajapov, A Khasanov, E Khaitbayev, M Khalilloev
Scientific committee, 108, 0
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