Polydimethylsiloxane membranes for millimeter-wave planar ultra flexible antennas N Tiercelin, P Coquet, R Sauleau, V Senez, H Fujita Journal of Micromechanics and Microengineering 16 (11), 2389, 2006 | 140 | 2006 |
Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy V Senez, A Armigliato, I De Wolf, G Carnevale, R Balboni, S Frabboni, ... Journal of Applied Physics 94 (9), 5574-5583, 2003 | 125 | 2003 |
Engineering sticky superomniphobic surfaces on transparent and flexible PDMS substrate R Dufour, M Harnois, Y Coffinier, V Thomy, R Boukherroub, V Senez Langmuir 26 (22), 17242-17247, 2010 | 95 | 2010 |
Analysis and application of a viscoelastic model for silicon oxidation V Senez, D Collard, B Baccus, M Brault, J Lebailly Journal of applied physics 76 (6), 3285-3296, 1994 | 86 | 1994 |
Zipping effect on omniphobic surfaces for controlled deposition of minute amounts of fluid or colloids R Dufour, P Brunet, M Harnois, R Boukherroub, V Thomy, V Senez Small 8 (8), 1229-1236, 2012 | 84 | 2012 |
Contact angle hysteresis origins: Investigation on super-omniphobic surfaces R Dufour, M Harnois, V Thomy, R Boukherroub, V Senez Soft Matter 7 (19), 9380-9387, 2011 | 78 | 2011 |
Two-dimensional simulation of local oxidation of silicon: calibrated viscoelastic flow analysis V Senez, D Collard, P Ferreira, B Baccus IEEE Transactions on Electron Devices 43 (5), 720-731, 1996 | 78 | 1996 |
Formation of silicon islands on a silicon on insulator substrate upon thermal annealing B Legrand, V Agache, JP Nys, V Senez, D Stiévenard Applied Physics Letters 76 (22), 3271-3273, 2000 | 67 | 2000 |
Wettability of PEDOT: PSS films C Duc, A Vlandas, GG Malliaras, V Senez Soft Matter 12 (23), 5146-5153, 2016 | 63 | 2016 |
From micro to nano reentrant structures: hysteresis on superomniphobic surfaces R Dufour, G Perry, M Harnois, Y Coffinier, V Thomy, V Senez, ... Colloid and Polymer Science 291, 409-415, 2013 | 59 | 2013 |
Modeling of the transient enhanced diffusion of boron implanted into preamorphized silicon E Lampin, V Senez, A Claverie Journal of applied physics 85 (12), 8137-8144, 1999 | 54 | 1999 |
Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling I De Wolf, V Senez, R Balboni, A Armigliato, S Frabboni, A Cedola, ... Microelectronic engineering 70 (2-4), 425-435, 2003 | 53 | 2003 |
Thermally assisted formation of silicon islands on a silicon-on-insulator substrate B Legrand, V Agache, T Melin, JP Nys, V Senez, D Stiévenard Journal of applied physics 91 (1), 106-111, 2002 | 49 | 2002 |
Label-free analysis of water-polluting parasite by electrochemical impedance spectroscopy T Houssin, J Follet, A Follet, E Dei-Cas, V Senez Biosensors and bioelectronics 25 (5), 1122-1129, 2010 | 48 | 2010 |
Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics G Carlotti, P Colpani, D Piccolo, S Santucci, V Senez, G Socino, L Verdini Thin Solid Films 414 (1), 99-104, 2002 | 45 | 2002 |
Acoustic tracking of Cassie to Wenzel wetting transitions R Dufour, N Saad, J Carlier, P Campistron, G Nassar, M Toubal, ... Langmuir 29 (43), 13129-13134, 2013 | 40 | 2013 |
Three-dimensional (3D) culture of adult murine colon as an in vitro model of cryptosporidiosis: Proof of concept M Baydoun, SB Vanneste, C Creusy, K Guyot, N Gantois, M Chabe, ... Scientific Reports 7 (1), 17288, 2017 | 37 | 2017 |
In-flow detection of ultra-small magnetic particles by an integrated giant magnetic impedance sensor K Fodil, M Denoual, C Dolabdjian, A Treizebre, V Senez Applied Physics Letters 108 (17), 2016 | 35 | 2016 |
Fabrication of superhydrophobic and highly oleophobic silicon-based surfaces via electroless etching method TPN Nguyen, R Dufour, V Thomy, V Senez, R Boukherroub, Y Coffinier Applied Surface Science 295, 38-43, 2014 | 35 | 2014 |
Stick–Jump (SJ) evaporation of strongly pinned nanoliter volume sessile water droplets on quick drying, micropatterned surfaces D Debuisson, A Merlen, V Senez, S Arscott Langmuir 32 (11), 2679-2686, 2016 | 32 | 2016 |