| MCU Tolerance in SRAMs Through Low-Redundancy Triple Adjacent Error Correction LJ Saiz-Adalid, P Reviriego, P Gil, S Pontarelli, JA Maestro Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 23 (10 …, 2015 | 73 | 2015 |
| Improving error correction codes for multiple-cell upsets in space applications J Gracia-Moran, LJ Saiz-Adalid, D Gil-Tomas, PJ Gil-Vicente IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (10 …, 2018 | 57 | 2018 |
| Analysis of the influence of intermittent faults in a microcontroller J Gracia, LJ Saiz, JC Baraza, D Gil, PJ Gil 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and …, 2008 | 48 | 2008 |
| Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor J Gracia-Moran, JC Baraza-Calvo, D Gil-Tomas, LJ Saiz-Adalid, ... Reliability, IEEE Transactions on 63 (1), 144-153, 2014 | 28 | 2014 |
| Studying the effects of intermittent faults on a microcontroller D Gil-Tomás, J Gracia-Morán, JC Baraza-Calvo, LJ Saiz-Adalid, ... Microelectronics Reliability 52 (11), 2837-2846, 2012 | 28 | 2012 |
| Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels LJ Saiz-Adalid, PJ Gil-Vicente, JC Ruiz-García, D Gil-Tomás, JC Baraza, ... International Conference on Computer Safety, Reliability, and Security, 178-189, 2013 | 27 | 2013 |
| Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection D Gil-Tomás, J Gracia-Morán, JC Baraza-Calvo, LJ Saiz-Adalid, ... Design & Test of Computers, IEEE 29 (6), 66-73, 2012 | 24 | 2012 |
| Injecting intermittent faults for the dependability assessment of a fault-tolerant microcomputer system D Gil-Tomás, J Gracia-Morán, JC Baraza-Calvo, LJ Saiz-Adalid, ... IEEE Transactions on Reliability 65 (2), 648-661, 2015 | 20 | 2015 |
| Experimental validation of a fault tolerant microcomputer system against intermittent faults J Gracia-Moran, D Gil-Tomas, LJ Saiz-Adalid, JC Baraza, PJ Gil-Vicente 2010 IEEE/IFIP International Conference on Dependable Systems & Networks …, 2010 | 20 | 2010 |
| Modified Hamming Codes to Enhance Short Burst Error Detection in Semiconductor Memories (Short Paper) LJ Saiz-Adalid, P Gil, J Baraza-Calvo, JC Ruiz, D Gil-Tomás, ... Dependable Computing Conference (EDCC), 2014 Tenth European, 62-65, 2014 | 18 | 2014 |
| Ultrafast codes for multiple adjacent error correction and double error detection LJ Saiz-Adalid, J Gracia-Moran, D Gil-Tomas, JC Baraza-Calvo, ... IEEE Access 7, 151131-151143, 2019 | 17 | 2019 |
| Ultrafast error correction codes for double error detection/correction LJ Saiz-Adalid, P Gil, JC Ruiz, J Gracia-Moran, D Gil-Tomas, ... 2016 12th European Dependable Computing Conference (EDCC), 108-119, 2016 | 17 | 2016 |
| Injecting intermittent faults for the dependability validation of commercial microcontrollers D Gil, LJ Saiz, J Gracia, JC Baraza, PJ Gil 2008 IEEE International High Level Design Validation and Test Workshop, 177-184, 2008 | 17 | 2008 |
| Reducing the overhead of BCH codes: New double error correction codes LJ Saiz-Adalid, J Gracia-Morán, D Gil-Tomás, JC Baraza-Calvo, ... Electronics 9 (11), 1897, 2020 | 14 | 2020 |
| Correction of adjacent errors with low redundant matrix error correction codes J Gracia-Moran, LJ Saiz-Adalid, JC Baraza-Calvo, P Gil 2018 Eighth Latin-American Symposium on Dependable Computing (LADC), 107-114, 2018 | 12 | 2018 |
| Searching representative and low cost fault models for intermittent faults in microcontrollers: a case study J Gracia-Morán, D Gil-Tomas, JC Baraza, LJ Saiz-Adalid, PJ Gil-Vicente 2010 IEEE 16th Pacific Rim International Symposium on Dependable Computing …, 2010 | 8 | 2010 |
| Applying fault injection to study the effects of intermittent faults LJ Saiz, J Gracia, JC Baraza, D Gil, PJ Gil 7th European Dependable Computing Conference, Kaunas, 67-69, 2008 | 6 | 2008 |
| Proposal of an adaptive fault tolerance mechanism to tolerate intermittent faults in RAM JC Baraza-Calvo, J Gracia-Morán, LJ Saiz-Adalid, D Gil-Tomás, ... Electronics 9 (12), 2074, 2020 | 5 | 2020 |
| Fault Modeling of Graphene Nanoribbon FET Logic Circuits D Gil-Tomàs, J Gracia-Morán, LJ Saiz-Adalid, PJ Gil-Vicente Electronics 8 (8), 851, 2019 | 5 | 2019 |
| Un nuevo Código de Corrección de Errores matricial con baja redundancia J Gracia-Morán, LJ Saiz-Adalid, D Gil-Tomás, PJ Gil-Vicente III Jornadas de Computación Empotrada y Reconfigurable (JCER2018), Jornadas …, 2018 | 5 | 2018 |
Joaquín Gracia-MoránUniversitat Politècnica de València在 disca.upv.es 的电子邮件经过验证
