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Sandro Sartoni
Sandro Sartoni
Verification Engineer @ TDK InvenSense | Ph.D. @ Politecnico di Torino
在 polito.it 的电子邮件经过验证
标题
引用次数
引用次数
年份
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs
FA da Silva, AC Bagbaba, S Sartoni, R Cantoro, MS Reorda, S Hamdioui, ...
2020 IEEE European Test Symposium (ETS), 1-6, 2020
142020
Self-test libraries analysis for pipelined processors transition fault coverage improvement
R Cantoro, P Girard, R Masante, S Sartoni, MS Reorda, A Virazel
2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021
112021
In-field functional test of can bus controllers
R Cantoro, S Sartoni, MS Reorda
2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020
112020
Recent trends and perspectives on defect-oriented testing
P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ...
2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022
92022
Effective techniques for automatically improving the transition delay fault coverage of self-test libraries
R Cantoro, F Garau, P Girard, N Kolahimahmoudi, S Sartoni, MS Reorda, ...
2022 IEEE European Test Symposium (ETS), 1-2, 2022
82022
New perspectives on core in-field path delay test
R Cantoro, D Foti, S Sartoni, MS Reorda, L Anghel, M Portolan
2020 IEEE International Test Conference (ITC), 1-5, 2020
82020
Self-test library generation for in-field test of path delay faults
L Anghel, R Cantoro, R Masante, M Portolan, S Sartoni, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2023
32023
Exploiting post-silicon debug hardware to improve the fault coverage of software test libraries
R Cantoro, F Garau, R Masante, S Sartoni, V Singh, MS Reorda
2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022
32022
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries
R Cantoro, S Sartoni, MS Reorda, L Anghel, M Portolan
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023
22023
A systematic method to generate effective stls for the in-field test of can bus controllers
FA da Silva, R Cantoro, S Hamdioui, S Sartoni, C Sauer, M Sonza Reorda
Electronics 11 (16), 2481, 2022
22022
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies
S Sartoni
Politecnico di Torino, 2023
2023
POS2-Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
R Cantoro, F Garau, P Girard, N Kolahimahmoudi, S Sartoni, MS Reorda, ...
2022
In-Field Functional Test of CAN Bus Controller
S Sartoni
Politecnico di Torino, 2019
2019
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