| Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness A Asenov, S Kaya, AR Brown IEEE Transactions on Electron Devices 50 (5), 1254-1260, 2003 | 742 | 2003 |
| Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs A Asenov, AR Brown, JH Davies, S Kaya, G Slavcheva IEEE transactions on electron devices 50 (9), 1837-1852, 2003 | 732 | 2003 |
| Intrinsic threshold voltage fluctuations in decanano MOSFETs due to local oxide thickness variations A Asenov, S Kaya, JH Davies IEEE Transactions on electron devices 49 (1), 112-119, 2002 | 287 | 2002 |
| iWISE: Inter-router wireless scalable express channels for network-on-chips (NoCs) architecture D DiTomaso, A Kodi, S Kaya, D Matolak 2011 IEEE 19th annual symposium on high performance interconnects, 11-18, 2011 | 147 | 2011 |
| A-winoc: Adaptive wireless network-on-chip architecture for chip multiprocessors D DiTomaso, A Kodi, D Matolak, S Kaya, S Laha, W Rayess IEEE Transactions on Parallel and Distributed Systems 26 (12), 3289-3302, 2014 | 108 | 2014 |
| Wireless networks-on-chips: architecture, wireless channel, and devices DW Matolak, A Kodi, S Kaya, D Ditomaso, S Laha, W Rayess IEEE Wireless Communications 19 (5), 58-65, 2012 | 108 | 2012 |
| A new frontier in ultralow power wireless links: Network-on-chip and chip-to-chip interconnects S Laha, S Kaya, DW Matolak, W Rayess, D DiTomaso, A Kodi IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 96 | 2014 |
| Optimization of RF linearity in DG-MOSFETs S Kaya, W Ma IEEE Electron Device Letters 25 (5), 308-310, 2004 | 85 | 2004 |
| Channel modeling for wireless networks-on-chips DW Matolak, S Kaya, A Kodi IEEE Communications Magazine 51 (6), 180-186, 2013 | 74 | 2013 |
| Fundamental characterization of asphalt clay nanocomposites MD Nazzal, S Kaya, T Gunay, P Ahmedzade Journal of Nanomechanics and Micromechanics 3 (1), 1-8, 2013 | 67 | 2013 |
| Using atomic force microscopy to evaluate the nanostructure and nanomechanics of warm mix asphalt MD Nazzal, L Abu-Qtaish, S Kaya, D Powers Journal of Materials in Civil Engineering 27 (10), 04015005, 2015 | 63 | 2015 |
| Multi-scale evaluation of the effect of rejuvenators on the performance of high RAP content mixtures MD Nazzal, W Mogawer, A Austerman, LA Qtaish, S Kaya Construction and Building Materials 101, 50-56, 2015 | 61 | 2015 |
| Multiscale evaluation of the composite asphalt binder in high–reclaimed asphalt pavement mixtures MD Nazzal, W Mogawer, S Kaya, T Bennert Journal of Materials in Civil Engineering 26 (7), 04014019, 2014 | 59 | 2014 |
| Effective mobilities in pseudomorphic Si/SiGe/Si metal-oxide-semiconductor field-effect transistors with thin silicon capping layers MJ Palmer, G Braithwaite, TJ Grasby, PJ Phillips, MJ Prest, EHC Parker, ... Applied Physics Letters 78 (10), 1424-1426, 2001 | 59 | 2001 |
| Analysis of statistical fluctuations due to line edge roughness in sub-0.1 μm MOSFETs S Kaya, AR Brown, A Asenov, D Magot, T LintonI Simulation of Semiconductor Processes and Devices 2001: SISPAD 01, 78-81, 2001 | 54 | 2001 |
| A systematic study of plasma activation of silicon surfaces for self assembly S Kaya, P Rajan, H Dasari, DC Ingram, W Jadwisienczak, F Rahman ACS applied materials & interfaces 7 (45), 25024-25031, 2015 | 46 | 2015 |
| Micromechanical and chemical characterization of foamed warm-mix asphalt aging L Abu Qtaish, MD Nazzal, A Abbas, S Kaya, S Akinbowale, MS Arefin, ... Journal of Materials in Civil Engineering 30 (9), 04018213, 2018 | 41 | 2018 |
| Monopoles loaded with 3-D-printed dielectrics for future wireless intrachip communications J Wu, AK Kodi, S Kaya, A Louri, H Xin IEEE Transactions on Antennas and Propagation 65 (12), 6838-6846, 2017 | 41 | 2017 |
| OWN: Optical and wireless network-on-chip for kilo-core architectures MAI Sikder, AK Kodi, M Kennedy, S Kaya, A Louri 2015 IEEE 23rd Annual Symposium on High-Performance Interconnects, 44-51, 2015 | 40 | 2015 |
| A review of polymethyl methacrylate (PMMA) as a versatile lithographic resist–With emphasis on UV exposure F Rahman, DJ Carbaugh, JT Wright, P Rajan, SG Pandya, S Kaya Microelectronic Engineering 224, 111238, 2020 | 39 | 2020 |
a asenovThe University of Glasgow在 glasgow.ac.uk 的电子邮件经过验证
