| Solar cell micro-crack detection using localised texture analysis TW Teo, MZ Abdullah Journal of Image and Graphics 6 (1), 54-58, 2018 | 49 | 2018 |
| In-line photoluminescence imaging of crystalline silicon solar cells for micro-crack detection TW Teo, MZ Abdullah 2016 IEEE International Conference on Imaging Systems and Techniques (IST …, 2016 | 10 | 2016 |
| Design of an imaging system for characterizing microcracks in crystalline silicon solar cells using light transflection TW Teo, Z Mahdavipour, MZ Abdullah IEEE Journal of Photovoltaics 9 (4), 1097-1104, 2019 | 8 | 2019 |
| Recent advancements in micro-crack inspection of crystalline silicon wafers and solar cells TW Teo, Z Mahdavipour, MZ Abdullah Measurement Science and Technology 31 (8), 081001, 2020 | 6 | 2020 |
| High-speed micro-crack detection of solar wafers with variable thickness TW Teo, Z Mahdavipour, MZ Abdullah 2014 IEEE International Conference on Imaging Systems and Techniques (IST …, 2014 | 5 | 2014 |
| Detection of microcracks and dark spots in monocrystalline PERC cells using photoluminescene imaging and YOLO-based CNN with spatial pyramid pooling A Binomairah, A Abdullah, BE Khoo, Z Mahdavipour, TW Teo, NSM Noor, ... EPJ Photovoltaics 13, 27, 2022 | 4 | 2022 |
| In-line optical micro-crack detection system for solar wafers Z Mahdavipour, TW Teo, MZ Abdullah Transactions of the Institute of Measurement and Control 39 (5), 728-737, 2017 | 4 | 2017 |
| Detection of oxygen precipitate dark rings in solar cell luminescence using gray level co-occurrence matrix TW Teo, MZ Abdullah 9th International Conference on Robotic, Vision, Signal Processing and Power …, 2017 | 3 | 2017 |
| Roadmap on industrial imaging techniques JR Lee, H Yoo, CC Ciang, YJ Kim, D Kim, TW Teo, Z Mahdavipour, ... Measurement Science and Technology 36 (1), 013001, 2024 | 1 | 2024 |
| Optical Setup for Solar Wafer Edge Chip Inspection TL Lim, TW Teo, MZ Abdullah 9th International Conference on Robotic, Vision, Signal Processing and Power …, 2016 | 1 | 2016 |
| CHARACTERISING MICRO-CRACKS IN CRYSTALLINE SILICON SOLAR CELLS USING TRANSFLECTION IMAGING TEOT WEE | | 2020 |
| Tri-Surface Solar Wafer Edge Chipping Inspection TL Lim, TW Teo, MZ Abdullah Proceedings of the International Conference on Imaging, Signal Processing …, 2017 | | 2017 |
