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Yuri Shreter
Yuri Shreter
在 mail.ioffe.ru 的电子邮件经过验证
标题
引用次数
引用次数
年份
Light emitting semiconductor device
S Lee, YG Shreter, YT Rebane, RI Gorbunov
US Patent 7,265,374, 2007
14392007
Polymers, phosphors, and voltaics for radioisotope microbatteries
KE Bower, YA Barbanel, YG Shreter, GW Bohnert
CRC press, 2002
1952002
Stacking faults as quantum wells for excitons in wurtzite GaN
YT Rebane, YG Shreter, M Albrecht
physica status solidi (a) 164 (1), 141-144, 1997
1541997
Cathodoluminescence and transmission electron microscopy study of the influence of crystal defects on optical transitions in GaN
G Salviati, M Albrecht, C Zanotti‐Fregonara, N Armani, M Mayer, ...
physica status solidi (a) 171 (1), 325-339, 1999
1171999
Defect-related tunneling mechanism of efficiency droop in III-nitride light-emitting diodes
NI Bochkareva, VV Voronenkov, RI Gorbunov, AS Zubrilov, YS Lelikov, ...
Applied Physics Letters 96 (13), 2010
1072010
Light emitting diodes with asymmetric resonance tunnelling
WN Wang, YG Shreter, YT Rebane
US Patent 6,614,060, 2003
892003
Strain and microstructure variation in grains of CVD diamond film
NC Burton, JW Steeds, GM Meaden, YG Shreter, JE Butler
Diamond and related materials 4 (10), 1222-1234, 1995
661995
Luminescence related to stacking faults in heterepitaxially grown wurtzite GaN
M Albrecht, S Christiansen, G Salviati, C Zanotti-Fregonara, YT Rebane, ...
MRS Online Proceedings Library (OPL) 468, 293, 1997
641997
Efficiency droop and incomplete carrier localization in InGaN/GaN quantum well light-emitting diodes
NI Bochkareva, YT Rebane, YG Shreter
Applied Physics Letters 103 (19), 2013
522013
Неоднородность инжекции носителей заряда и деградация голубых светодиодов
НИ Бочкарева, АА Ефремов, ЮТ Ребане, РИ Горбунов, АВ Клочков, ...
Физика и техника полупроводников 40 (1), 122, 2006
442006
Unipolar light emitting devices based on III-nitride semiconductor superlattices
WN Wang, YG Shreter, YT Rebane
US Patent 6,455,870, 2002
422002
Influence of Poisson's ratio uncertainty on calculations of the bowing parameter for strained InGaN layers
S Stepanov, WN Wang, BS Yavich, V Bougrov, YT Rebane, YG Shreter
Materials Research Society Internet Journal of Nitride Semiconductor …, 2001
422001
Light emitting diode with charge asymmetric resonance tunneling
YT Rebane, YG Shreter, BS Yavich, VE Bougrov, SI Stepanov, WN Wang
physica status solidi (a) 180 (1), 121-126, 2000
392000
Широкозонные полупроводники
ЮГ Шретер, ЮТ Ребане, ВА Зыков, ВГ Сидоров
Санкт-Перербург,“Наука, 122, 2001
372001
Nature of V-shaped defects in GaN
V Voronenkov, N Bochkareva, R Gorbunov, P Latyshev, Y Lelikov, ...
Japanese Journal of Applied Physics 52 (8S), 08JE14, 2013
332013
Laser slicing: A thin film lift-off method for GaN-on-GaN technology
V Voronenkov, N Bochkareva, R Gorbunov, A Zubrilov, V Kogotkov, ...
Results in Physics 13, 102233, 2019
322019
MD Brem ser, and RF Davis
YG Shreter, YT Rebane
Mater. Res. Soc 449, 683, 1997
311997
Degradation and transient currents in III-nitride LEDs
YT Rebane, NI Bochkareva, VE Bougrov, DV Tarkhin, YG Shreter, ...
Light-Emitting Diodes: Research, Manufacturing, and Applications VII 4996 …, 2003
272003
Two modes of HVPE growth of GaN and related macrodefects
VV Voronenkov, NI Bochkareva, RI Gorbunov, PE Latyshev, YS Lelikov, ...
physica status solidi c 10 (3), 468-471, 2013
262013
Механизм падения эффективности GaN-светодиодов с ростом тока
НИ Бочкарева, ВВ Вороненков, РИ Горбунов, АС Зубрилов, ...
Физика и техника полупроводников 44 (6), 822-828, 2010
252010
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