| High-dimensional process monitoring and fault isolation via variable selection K Wang, W Jiang Journal of Quality Technology 41 (3), 247, 2009 | 183 | 2009 |
| Using profile monitoring techniques for a data‐rich environment with huge sample size K Wang, F Tsung Quality and Reliability Engineering International 21 (7), 677-688, 2005 | 175 | 2005 |
| A variable-selection-based multivariate EWMA chart for process monitoring and diagnosis W Jiang, K Wang, F Tsung Quality control and applied statistics 58 (5), 443-444, 2013 | 99 | 2013 |
| A variable-selection-based multivariate EWMA chart for process monitoring and diagnosis W Jiang, K Wang, F Tsung Journal of Quality Technology 44 (3), 209-230, 2012 | 99 | 2012 |
| A review of reliability research on nanotechnology SL Jeng, JC Lu, K Wang Reliability, IEEE Transactions on 56 (3), 401-410, 2007 | 78 | 2007 |
| A review of statistical methods for quality improvement and control in nanotechnology JC Lu, SL Jeng, K Wang Journal of Quality Technology 41 (2), 148, 2009 | 66 | 2009 |
| Monitoring the covariance matrix via penalized likelihood estimation B Li, K Wang, AB Yeh IIE Transactions 45 (2), 132-146, 2013 | 55 | 2013 |
| Statistical surface monitoring by spatial-structure modeling A Wang, F Tsung, K Wang Quality control and applied statistics 60 (3), 229-232, 2015 | 53 | 2015 |
| Statistical Surface Monitoring by Spatial-Structure Modeling A Wang, K Wang, F Tsung Journal of Quality Technology 46 (4), 359, 2014 | 53 | 2014 |
| Monitoring Wafer Geometric Quality using Additive Gaussian Process Model L Zhang, K Wang, N Chen IIE Transactions, 00-00, 2015 | 52 | 2015 |
| CUSUM and EWMA multi-charts for detecting a range of mean shifts D Han, F Tsung, X Hu, K Wang Statistica Sinica 17 (3), 1139, 2007 | 51 | 2007 |
| Adaptive charting techniques: Literature review and extensions F Tsung, K Wang Frontiers in Statistical Quality Control 9, 19-35, 2010 | 44 | 2010 |
| Adaptive Charting Techniques F Tsung, K Wang Proceedings of the IXth International Workshop on Intelligent Statistical …, 2007 | 44* | 2007 |
| Monitoring multivariate process variability with individual observations via penalised likelihood estimation AB Yeh, B Li, K Wang International Journal of Production Research 50 (22), 6624-6638, 2012 | 43 | 2012 |
| Simultaneous monitoring of process mean vector and covariance matrix via penalized likelihood estimation K Wang, AB Yeh, B Li Computational Statistics & Data Analysis 78, 206-217, 2014 | 42 | 2014 |
| Run-to-run process adjustment using categorical observations K Wang, F Tsung Journal of Quality Technology 39 (4), 312-325, 2007 | 40 | 2007 |
| A hierarchical model for characterising spatial wafer variations L Bao, K Wang, R Jin International Journal of Production Research 52 (6), 1827-1842, 2014 | 27 | 2014 |
| An adaptive T2 chart for monitoring dynamic systems K Wang, F Tsung Journal of Quality Technology 40 (1), 109, 2008 | 27 | 2008 |
| Process adjustment with an asymmetric quality loss function J Zhang, W Li, K Wang, R Jin Journal of Manufacturing Systems 33 (1), 159-165, 2014 | 24 | 2014 |
| A general harmonic rule controller for run-to-run process control F He, K Wang, W Jiang Semiconductor Manufacturing, IEEE Transactions on 22 (2), 232-244, 2009 | 24 | 2009 |
