Modern scattering‐type scanning near‐field optical microscopy for advanced material research X Chen, D Hu, R Mescall, G You, DN Basov, Q Dai, M Liu Advanced Materials 31 (24), 1804774, 2019 | 287 | 2019 |
Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging D Hu, X Yang, C Li, R Liu, Z Yao, H Hu, SNG Corder, J Chen, Z Sun, ... Nature communications 8 (1), 1471, 2017 | 110 | 2017 |
Tunable modal birefringence in a low‐loss Van Der Waals waveguide D Hu, K Chen, X Chen, X Guo, M Liu, Q Dai Advanced Materials 31 (27), 1807788, 2019 | 38 | 2019 |
Refractive-index-enhanced Raman spectroscopy and absorptiometry of ultrathin film overlaid on an optical waveguide DB Hu, ZM Qi The Journal of Physical Chemistry C 117 (31), 16175-16181, 2013 | 23 | 2013 |
Resonant mirror enhanced Raman spectroscopy DB Hu, C Chen, ZM Qi The Journal of Physical Chemistry C 118 (24), 13099-13106, 2014 | 7 | 2014 |
Near-field optical characterization of low-dimensional nanomaterials D HU, Q DAI Chinese Science Bulletin 63 (35), 67-79, 2018 | 3 | 2018 |
Eigenmodes in a negative-refractive-index planar waveguide for high-sensitivity evanescent sensing and spectroscopic applications DB Hu, ZM Qi 2013 International Conference on Optical Instruments and Technology: Optical …, 2013 | 1 | 2013 |