raghunath sai puttagunta 个人学术档案

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Zhu LiUniversity of Missouri, Kansas City在 ieee.org 的电子邮件经过验证
Hoang (Mark) NguyenAI and Data Scientist在 perimetermed.com 的电子邮件经过验证
Reza DerakhshaniProfessor, Computer Science and Electrical Engineering, University of Missouri-Kansas在 umkc.edu 的电子邮件经过验证
Ajita Rattani, PhDAssistant Professor at University of North Texas在 unt.edu 的电子邮件经过验证
Ahmad Saeed MohammadAssistant Professor, Computer Eng Dept, Mustansiriyah University. | Ph.D. Electrical&Computer Eng在 uomustansiriyah.edu.iq 的电子邮件经过验证
Shuvra S. BhattacharyyaProfessor of Electrical and Computer Engineering, University of Maryland在 umd.edu 的电子邮件经过验证
George YorkUS Air Force Academy在 yorkshome.com 的电子邮件经过验证
Renlong Hang （杭仁龙）Nanjing University of Information Science and Technology在 nuist.edu.cn 的电子邮件经过验证

raghunath sai puttagunta

PhD student at UMKC

在 mail.umkc.edu 的电子邮件经过验证


标题按引用次数排序按年份排序按标题排序	引用次数引用次数	年份
Authentication verification using soft biometric traits AS Mohammad, DHH Nguyen, A Rattani, RS Puttagunta, Z Li, ... US Patent 10,922,399, 2021	7	2021
User re-identification using clothing information for smartphones M Nguyen, R Puttagunta, Z Li, R Derakhshani 2018 IEEE International Symposium on Technologies for Homeland Security (HST …, 2018	4	2018
Appearance Label Balanced Triplet Loss for Multi-modal Aerial View Object Classification RS Puttagunta, Z Li, S Bhattacharyya, G York Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023	2	2023
Low resolution recognition of aerial images RS Puttagunta, R Hang, Z Li, S Bhattacharyya 2019 IEEE Visual Communications and Image Processing (VCIP), 1-4, 2019	1	2019
Multi-Scale Feature Fusion using Channel Transformers for Guided Thermal Image Super Resolution RS Puttagunta, B Kathariya, Z Li, G York Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2024		2024
Authentication verification using soft biometric traits AS Mohammad, DHH Nguyen, A Rattani, RS Puttagunta, Z Li, ... US Patent 10,885,171, 2021		2021
Spectral Super Resolution with DCT Decomposition and Deep Residual Learning RS Puttagunta, R Hang, Z Li, S Bhattacharyya, G York Dynamic Data Driven Applications Systems: Third International Conference …, 2020		2020

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