| Towards automated nanoassembly with the atomic force microscope: A versatile drift compensation procedure F Krohs, C Onal, M Sitti, S Fatikow | 43 | 2009 |
| Nanobits: customizable scanning probe tips RTR Kumar, SU Hassan, OS Sukas, V Eichhorn, F Krohs, S Fatikow, ... Nanotechnology 20 (39), 395703, 2009 | 39 | 2009 |
| Synchro-PASEF allows precursor-specific fragment ion extraction and interference removal in data-independent acquisition P Skowronek, F Krohs, M Lubeck, G Wallmann, ECM Itang, P Koval, ... Molecular & Cellular Proteomics 22 (2), 2023 | 32 | 2023 |
| Development of a novel process chain based on atomic force microscopy scratching for small and medium series production of polymer nanostructured components EB Brousseau, F Krohs, E Caillaud, S Dimov, O Gibaru, S Fatikow | 30 | 2010 |
| Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam milling A Savenko, I Yildiz, DH Petersen, P Bøggild, M Bartenwerfer, F Krohs, ... Nanotechnology 24 (46), 465701, 2013 | 21 | 2013 |
| midiaPASEF maximizes information content in data-independent acquisition proteomics U Distler, MK Łącki, MP Startek, D Teschner, S Brehmer, J Decker, ... BioRxiv, 2023.01. 30.526204, 2023 | 20 | 2023 |
| Development of automated microrobot-based nanohandling stations for nanocharacterization S Fatikow, V Eichhorn, F Krohs, I Mircea, C Stolle, S Hagemann Microsystem Technologies 14, 463-474, 2008 | 17 | 2008 |
| Automated nanorobotic handling of bio-and nano-materials S Fatikow, V Eichhorn, D Jasper, M Weigel-Jech, F Niewiera, F Krohs 2010 IEEE International Conference on Automation Science and Engineering, 1-6, 2010 | 15 | 2010 |
| Flexural-torsional resonance mode of a chip cantilever system: applications to nanomachining F Voigt, F Krohs, R Gerbach Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 9 | 2009 |
| Automated handling of bio-nanowires for nanopackaging S Fatikow, M Bartenwerfer, F Krohs, M Mikczinski, F Niewiera, ... 2010 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2010 | 7 | 2010 |
| Advanced Atomic Force Microscope based System for Manipulating at the Nanoscale F Krohs, M Weigel-Jech, U Mick, M Isken, S Fatikow IFAC Proceedings Volumes 42 (16), 615-620, 2009 | 6 | 2009 |
| Towards automation in AFM based nanomanipulation and electron beam induced deposition for microstructuring F Krohs, T Luttermann, C Stolle, S Fatikow, EB Brousseau, S Dimov Proceedings of the Fourth International Conference on Multi-Material Micro …, 2008 | 6 | 2008 |
| Automated cell characterization by a nanohandling robot station F Krohs, S Hagemann, S Fatikow 2007 Mediterranean Conference on Control & Automation, 1-6, 2007 | 6 | 2007 |
| AFM as a robot for automated nanohandling S Fatikow, F Krohs, M Bartenwerfer, U Mick, F Niewiera, M Weigel-Jech ICCAS 2010, 2271-2276, 2010 | 5 | 2010 |
| A probabilistic approach to drift compensation towards autonomous nanomanipulation using an atomic force microscope F Krohs, CD Onal, M Sitti, S Fatikow ASME Journal of Dynamic Systems, Measurement, and Control, under review 1, 3, 2009 | 4 | 2009 |
| Automated characterization and manipulation of biological cells by a nanohandling robot station S Hagemann, F Krohs, S Fatikow Poster presented at Nanotech Northern Europe Conference and Exhibition …, 2007 | 4 | 2007 |
| Elastic properties of graphene grown by chemical vapor deposition X Zhang, C Liang, S Zimmermann, F Krohs, Y Wang, T Li 2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS …, 2015 | 3 | 2015 |
| Atomic force microscopy for high resolution sidewall scans F Krohs, OC Haenssler, M Bartenwerfer, S Fatikow 2014 International Conference on Manipulation, Manufacturing and Measurement …, 2014 | 3 | 2014 |
| Nanorobotic AFM/SEM/FIB system for processing, manipulation and characterization of nanomaterials S Fatikow, V Eichhorn, M Bartenwerfer, F Krohs 2013 IEEE 18th Conference on Emerging Technologies & Factory Automation …, 2013 | 3 | 2013 |
| Novel high-resolution sidewall imaging using standard Atomic Force Microscopy equipment: Exceeding surface scanning using customized FIB-milled AFM tips in torsional feedback mode F Krohs, S Fatikow 2013 Seventh International Conference on Sensing Technology (ICST), 608-611, 2013 | 2 | 2013 |
Malte BartenwerferResearch Associate, University of Oldenburg在 uni-oldenburg.de 的电子邮件经过验证
