| Fault detection, diagnosis and prediction in electrical valves using self-organizing maps LF Gonçalves, JL Bosa, TR Balen, MS Lubaszewski, EL Schneider, ... Journal of Electronic Testing 27, 551-564, 2011 | 53 | 2011 |
| Applying the oscillation test strategy to FPAA’s configurable analog blocks TR Balen, AQ Andrade, F AzaÏs, M Lubaszewski, M Renovell Journal of Electronic Testing 21, 135-146, 2005 | 25 | 2005 |
| Built-in self-test of field programmable analog arrays based on transient response analysis TR Balen, JV Calvano, MS Lubaszewski, M Renovell Journal of Electronic Testing 23, 497-512, 2007 | 22 | 2007 |
| A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs TR Balen, F Leite, FL Kastensmidt, M Lubaszewski IEEE transactions on nuclear science 56 (4), 1950-1957, 2009 | 21 | 2009 |
| Using bulk built-in current sensors and recomputing techniques to mitigate transient faults in microprocessors F Leite, T Balen, M Herve, M Lubaszewski, G Wirth 2009 10th Latin American Test Workshop, 1-6, 2009 | 21 | 2009 |
| Functional test of field programmable analog arrays TR Balen, JV Calvano, MS Lubaszewski, M Renovelf 24th IEEE VLSI Test Symposium, 6 pp.-333, 2006 | 20 | 2006 |
| Built-in self-test of global interconnects of field programmable analog arrays A Andrade Jr, G Vieira, TR Balen, M Lubaszewski, F Azaïs, M Renovell Microelectronics Journal 36 (12), 1112-1123, 2005 | 18 | 2005 |
| Testing the interconnect networks and I/O resources of field programmable analog arrays G Pereira, M Lubaszewski, A Andrade, TR Balen, F Azaïs, M Renovell 23rd IEEE VLSI Test Symposium (VTS'05), 389-394, 2005 | 17 | 2005 |
| Exploring design diversity redundancy to improve resilience in mixed-signal systems CP Chenet, LA Tambara, GM de Borges, F Kastensmidt, MS Lubaszewski, ... microelectronics Reliability 55 (12), 2833-2844, 2015 | 16 | 2015 |
| Testing the configurable analog blocks of field programmable analog arrays T Balen, A Andrade, F Azaïs, M Lubaszewski, M Renovell 2004 International Conferce on Test, 893-902, 2004 | 16 | 2004 |
| Single event transient effects on charge redistribution SAR ADCs TE Becker, AJC Lanot, GS Cardoso, TR Balen Microelectronics Reliability 73, 22-35, 2017 | 15 | 2017 |
| An approach to the built-in self-test of field programmable analog arrays T Balen, A Andrade, F Azaïs, M Lubaszewski, M Renovell 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 383-388, 2004 | 15 | 2004 |
| Analyzing the behavior of FinFET SRAMs with resistive defects TS Copetti, TR Balen, GC Medeiros, LMB Poehls 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 14 | 2017 |
| Reliability Analysis of 0.5 μm CMOS Operational Amplifiers under TID Effects GS Cardoso, TR Balen, MS Lubaszewski, OL Gonçalez Journal of Integrated Circuits and Systems 9 (1), 70-79, 2014 | 13 | 2014 |
| Analysis of the effects of single event transients on an sar-adc based on charge redistribution AJC Lanot, TR Balen 2014 15th Latin American Test Workshop-LATW, 1-5, 2014 | 12 | 2014 |
| Low-voltage dynamic comparator using positive feedback bulk effect on a floating inverter amplifier B Canal, HD Klimach, S Bampi, TR Balen Analog integrated circuits and signal processing 108 (3), 511-524, 2021 | 11 | 2021 |
| TID effects on a data acquisition system with design diversity redundancy CJ Gonzalez, RG Vaz, MB Oliveira, VW Leorato, OL Goncalez, TR Balen IEEE Transactions on Nuclear Science 65 (1), 583-590, 2017 | 11 | 2017 |
| Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC L Tambara, F Kastensmidt, P Rech, T Balen, M Lubaszewski 2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 188-193, 2013 | 11 | 2013 |
| Reducing soft error rate of SoCs analog-to-digital interfaces with design diversity redundancy CJ González, N Added, ELA Macchione, VAP Aguiar, FGL Kastensmidt, ... IEEE Transactions on Nuclear Science 67 (3), 518-524, 2019 | 10 | 2019 |
| Radiation effects in low power and ultra-low power voltage references D Fusco, TR Balen Journal of Low Power Electronics 12 (4), 403-412, 2016 | 10 | 2016 |
