Solid-state synthesis of stable and color tunable cesium lead halide perovskite nanocrystals and the mechanism of high-performance photodetection in a monolayer MoS 2/CsPbBr 3 … J Ghosh, LPL Mawlong, GB Manasa, AJ Pattison, W Theis, S Chakraborty, ... Journal of Materials Chemistry C 8 (26), 8917-8934, 2020 | 64 | 2020 |
Strongly enhanced visible light photoelectrocatalytic hydrogen evolution reaction in an n-doped MoS 2/TiO 2 (B) heterojunction by selective decoration of platinum nanoparticles … KK Paul, N Sreekanth, RK Biroju, AJ Pattison, D Escalera-López, A Guha, ... Journal of Materials Chemistry A 6 (45), 22681-22696, 2018 | 56 | 2018 |
Direct strain correlations at the single-atom level in three-dimensional core-shell interface structures H Jo, DH Wi, T Lee, Y Kwon, C Jeong, J Lee, H Baik, AJ Pattison, W Theis, ... Nature communications 13 (1), 5957, 2022 | 27 | 2022 |
Exploring the atomic structure of 1.8 nm monolayer-protected gold clusters with aberration-corrected STEM J Liu, N Jian, I Ornelas, AJ Pattison, T Lahtinen, K Salorinne, H Häkkinen, ... Ultramicroscopy 176, 146-150, 2017 | 10 | 2017 |
Advanced techniques in automated high-resolution scanning transmission electron microscopy AJ Pattison, CCS Pedroso, BE Cohen, JC Ondry, AP Alivisatos, W Theis, ... Nanotechnology 35 (1), 015710, 2023 | 9 | 2023 |
Classifying handedness in chiral nanomaterials using label error robust deep learning CK Groschner, AJ Pattison, A Ben-Moshe, AP Alivisatos, W Theis, ... npj Computational Materials 8 (1), 149, 2022 | 7 | 2022 |
BEACON--Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization AJ Pattison, SM Ribet, MM Noack, G Varnavides, K Park, E Kirkland, ... arXiv preprint arXiv:2410.14873, 2024 | 3 | 2024 |
Statistical 3D morphology characterization of vaterite microspheres produced by engineered Escherichia coli AYW Lin, ZY Wu, AJ Pattison, IE Müller, Y Yoshikuni, W Theis, P Ercius Biomaterials advances 156, 213711, 2024 | 2 | 2024 |
Beyond MicroED: Ab Initio Structure Elucidation using 4D-STEM A Saha, A Pattison, M Mecklenburg, A Brewster, P Ercius, JA Rodriguez Microscopy and Microanalysis 29 (Supplement_1), 309-310, 2023 | 2 | 2023 |
Applying automation and machine learning to scanning transmission electron microscopy AJ Pattison University of Birmingham, 2021 | 1 | 2021 |
Atomic-Scale Scanning of Domain Network in the Ferroelectric HfO2 Thin Film K Park, D Kim, K Lee, HJ Lee, J Kim, S Kang, A Lin, AJ Pattison, W Theis, ... ACS nano 18 (38), 26315-26326, 2024 | | 2024 |
Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy AJ Pattison, CCS Pedroso, BE Cohen, JC Ondry, AP Alivisatos, W Theis, ... Microscopy and Microanalysis 30 (Supplement_1), ozae044. 192, 2024 | | 2024 |
Towards Autonomous Experiments by Connecting High Performance Microscopy with High Performance Computing P Ercius, AJ Pattison, W Theis, C Harris, SS Welborn, B Enders Microscopy and Microanalysis 30 (Supplement_1), ozae044. 1011, 2024 | | 2024 |
Atomic-Scale 3D Structural Analysis of Core-Shell Nanoparticles H Jo, DH Wi, T Lee, Y Kwon, C Jeong, J Lee, H Baik, AJ Pattison, W Theis, ... Microscopy and Microanalysis 30 (Supplement_1), ozae044. 887, 2024 | | 2024 |
Mapping electron beam-induced radiolytic damage in molecular crystals A Saha, M Mecklenburg, A Pattison, A Brewster, JA Rodriguez, P Ercius Microscopy and Microanalysis 30 (Supplement_1), ozae044. 902, 2024 | | 2024 |
Training Neural Networks to Classify Chiral Nanoparticle Stereopairs Using Weakly Labelled Datasets AJ Pattison, M Scott, P Ercius, W Theis Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2024 | | 2024 |
Automating STEM Aberration Correction via Bayesian Optimization AJ Pattison, M Noack, P Ercius Microscopy and Microanalysis 29 (Supplement_1), 1881-1882, 2023 | | 2023 |
Beyond Microed: Ab Initio Crystal Structures Using 4D-STEM A Saha, A Pattison, M Mecklenburg, A Brewster, P Ercius, JA Rodriguez | | 2023 |
3D Structural Determination of Core-shell Nanoparticles H Jo, DH Wi, T Lee, C Jeong, J Lee, H Baik, AJ Pattison, W Theis, ... Microscopy and Microanalysis 28 (S1), 216-216, 2022 | | 2022 |
Correlating Automated High-Throughput ADF-STEM and 4D-STEM Imaging for the Characterization of Irradiation-Induced Defects A Lin, SH Mills, A Pattison, W Theis, A Minor, P Ercius Microscopy and Microanalysis 28 (S1), 2064-2066, 2022 | | 2022 |